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MA7001 Datasheet, PDF (3/15 Pages) Dynex Semiconductor – Radiation Hard 512x9 Bit FIFO
AC CHARACTERISTICS
Characteristics apply to pre-radiation at TA = -55°C to +125°C, VDD = 5V ±10% and post
100kRad(Si) total dose radiation at TA = 25°C, VDD = 5V ±10%. GROUP A SUBGROUP 9, 10, 11.
Symbol Parameter
Min.
Max. Units
tRC
Read Cycle Time
110
-
ns
tA
Access Time
-
100
ns
tRR
Read Recovery Time
25
-
ns
tRPW
Read Pulse Width (Note 2)
85
-
ns
tRLZ
Read Pulse Low to Data Bus at Low Z (Note 3)
10
-
ns
tDV
Data Valid from Read Pulse High
20
-
ns
tRHZ
Read Pulse High to Data Bus at High Z (Note 3)
-
30
ns
tWC
Write Cycle Time
100
-
ns
tWPW
Write Pulse Width (Note 2)
80
-
ns
tWR
Write Recovery Time
20
-
ns
tDS
Data Setup Time
40
-
ns
tDH
Data Hold Time
10
-
ns
tRSC
Reset Cycle Time (Note 3)
100
-
ns
tRS
Reset Pulse Width (Note 2)
80
-
ns
tRSR
Reset Recovery Time (Note 3)
20
-
ns
tRTC
Retransmit Cycle Time (Note 3)
100
-
ns
tRT
Retransmit Pulse Width (Note 2)
80
-
ns
tRTR
Retransmit Recovery Time (Note 3)
20
-
ns
tEFL
Reset to Empty Flag Low
-
100
ns
tREF
Read Low to Empty Flag Low
-
90
ns
tRFF
Read High to Full Flag High
-
70
ns
tWEF
Write High to Empty Flag High
-
70
ns
tWFF
Write Low to Full Flag Low
-
90
ns
tEFR
EF High to Valid Read (Note 3)
10
-
ns
tRPI
Read Protect Indeterminant (Note 3)
-
35
ns
tFFW
FF High to Valid Wrlte (Note 3)
10
-
ns
tWPI
Write Protect Indeterminant (Note 3)
-
35
ns
Notes:
1. Timings referenced as in A.C. Test Conditions, figure 5
2. Pulse wldths less than minimum values are not allowed
3. Values guaranteed by deslgn, not currently tested
Figure 3b: AC Characteristics
MA7001
3/15