English
Language : 

74AUP2G34 Datasheet, PDF (7/12 Pages) NXP Semiconductors – Low-power dual buffer
Parameter Measurement Information
74AUP2G34
VCC
0.8V
1.2V±0.1V
1.5V±0.1V
1.8V±0.15V
2.5V±0.2V
3.3V±0.3V
Inputs
VI
tr/tf
VCC
≤3ns
VCC
≤3ns
VCC
≤3ns
VCC
≤3ns
VCC
≤3ns
VCC
≤3ns
VM
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
CL
5, 10, 15, 30pF
5, 10, 15, 30pF
5, 10, 15, 30pF
5, 10, 15, 30pF
5, 10, 15, 30pF
5, 10, 15, 30pF
Voltage Waveform Pulse Duration
Voltage Waveform Propagation Delay Times
Inverting and Non Inverting Outputs
Figure 1 Load Circuit and Voltage Waveforms
Notes:
A. Includes test lead and test apparatus capacitance.
B. All pulses are supplied at pulse repetition rate ≤ 10 MHz.
C. Inputs are measured separately one transition per measurement.
D. tPLH and tPHL are the same as tPD.
74AUP2G34
Document number: DS35514 Rev. 5 - 2
7 of 12
www.diodes.com
May 2014
© Diodes Incorporated