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DS2196 Datasheet, PDF (6/157 Pages) Dallas Semiconductor – T1 Dual Framer LIU
DS2196
1. INTRODUCTION
The DS2196 is a derivative of the DS21352 T1 SCT. The feature set has been optimized for transport
applications commonly found in T1 transmission equipment. The DS2196 register map and register bit
definitions are compatible with the DS21352/DS21552, allowing for easy migration to the DS2196.
Interface designs requiring per-channel code insertion, elastic stores, and ANSI 1’s density monitoring
should use the DS21352 or DS21552.
1.1 Feature Highlights
§ Main features
– Two full-featured independent framers
– Short/long haul LIU
– 100-pin LQFP small package
– 3.3V operation with 5V tolerant I/O
§ 8-bit parallel control port
– Multiplexed or nonmultiplexed buses
– Intel or Motorola formats
– Polled or interrupt environments
§ HDLC Support
– Two independent HDLC controllers
– 64-byte Rx and Tx buffers
– Access FDL or single/multiple DS0
channels
§ ANSI T1.403-1998 support
– NPRMs
– SPRMs
– RAI-CI detection and generation
– AIS-CI detection and generation
§ Format Conversion
– D4 to ESF framing
– ESF to D4 framing
§ LIU
– Long and short-haul support
– Receive sensitivity: 0dB to -36dB
– 32-bit or 128-bit crystal-less jitter
attenuator
– DSX-1 and CSU line buildout options
– Provisions for custom waveform
generation
§ DS1 Idle Code Generation
– User-defined
– Fixed 7F Hex
– Digital milliwatt
§ In-band repeating pattern generator and
detector
– Programmable pattern generator
– Three programmable pattern detectors
– Patterns from 1 to 8 bits or 16 bits in
length
§ Programmable on-chip bit error-rate testing
– Pseudorandom patterns including QRSS
– User-defined repetitive patterns
– Daly pattern
– Error insertion
– Bit and error counts
§ Payload Error Insertion
– Error insertion in the payload portion of
the T1 frame in the transmit path
– Errors can be inserted over the entire
frame or selected channels
– Insertion options include continuous and
absolute number with selectable insertion
rates
§ Function Isolation
– All key signals are routed to pins
– LIU, Framer A, and Framer B can be
disconnected from each other
§ Supports both NRZ and bipolar interfaces
§ F-bit corruption for line testing
§ Programmable output clocks for Fractional
T1
§ Fully independent transmit and receive
functionality in each framer
§ Large path and line error counters including
BPV, CV, CRC6, and framing bit errors
§ Ability to calculate and check CRC6
according to the Japanese standard
§ Ability to generate Yellow Alarm according
to the Japanese standard
§ Per channel loopback
§ RCL, RLOS, RRA, and RAIS alarms
interrupt on change of state
§ Hardware pins to indicate receive loss-of-
sync and receive bipolar violations
§ IEEE 1149.1 JTAG Boundary Scan
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