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W255H Datasheet, PDF (4/10 Pages) Cypress Semiconductor – 200-MPz 24-Output Buffer for 4DDR or 3 SDRAM DIMMS
W255
Maximum Ratings
Supply Voltage to Ground Potential ..................–0.5 to +7.0V
DC Input Voltage (except BUF_IN) ............ –0.5V to VDD+0.5
Operating Conditions [2]
Storage Temperature.................................. –65°C to +150°C
Static Discharge Voltage .......................................... > 2000V
(per MIL-STD-883, Method 3015)
Parameter
VDD3.3
VDD2.5
TA
COUT
CIN
Description
Supply Voltage
Supply Voltage
Operating Temperature (Ambient Temperature)
Output Capacitance
Input Capacitance
Min.
Typ.
Max.
Unit
3.135
3.465
V
2.375
2.625
V
0
70
°C
6
pF
5
pF
Electrical Characteristics Over the Operating Range
Parameter
VIL
VIH
IIL
IIH
IOH
Description
Input LOW Voltage
Input HIGH Voltage
Input LOW Current
Input HIGH Current
Output HIGH Current
IOL
VOL
VOH
IDD
IDD
IDDS
VOUT
Output LOW Current
Output LOW Voltage[3]
Output HIGH Voltage[3]
Supply Current[3]
(DDR-only mode)
Supply Current
(DDR-only mode)
Supply Current
Output Voltage Swing
VOC
Output Crossing Voltage
INDC
Input Clock Duty Cycle
Test Conditions
For all pins except SMBus
VIN = 0V
VIN = VDD
VDD = 2.375V
VOUT = 1V
VDD = 2.375V
VOUT = 1.2V
IOL = 12 mA, VDD = 2.375V
IOH = –12 mA, VDD = 2.375V
Unloaded outputs, 133 MHz
Min.
2.0
–18
26
1.7
Loaded outputs, 133 MHz
PWR_DWN# = 0
See test circuity (refer to
Figure 1)
0.7
(VDD/2)
–0.1
48
Typ.
Max.
0.8
50
50
–32
35
0.6
400
500
VDD/2
100
VDD +0.6
(VDD/2)
+0.1
52
Unit
V
V
µA
µA
mA
mA
V
V
mA
mA
µA
V
V
%
Switching Characteristics [4]
Parameter
Name
Test Conditions
Min. Typ. Max. Unit
–
Operating Frequency
66
–
Duty Cycle[3, 5] = t2 ÷ t1
Measured at 1.4V for 3.3V outputs
INDC
Measured at VDD/2 for 2.5V outputs –5%
t3
SDRAM Rising Edge Rate[3]
Measured between 0.4V and 2.4V
1.0
t4
SDRAM Falling Edge Rate[3]
Measured between 2.4V and 0.4V
1.0
t3d
DDR Rising Edge Rate[3]
Measured between 20% to 80% of
0.5
output (refer to Figure 1)
200
INDC
+5%
2.75
2.75
1.50
MHz
%
V/ns
V/ns
V/ns
Notes:
2. Multiple Supplies: The voltage on any input or I/O pin cannot exceed the power pin during power-up. Power supply sequencing is NOT required.
3. Parameter is guaranteed by design and characterization. Not 100% tested in production.
4. All parameters specified with loaded outputs.
5. Duty cycle of input clock is 50%. Rising and falling edge rate is greater than 1 V/ns.
Document #: 38-07255 Rev. *C
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