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CAT5261_08 Datasheet, PDF (5/15 Pages) Catalyst Semiconductor – Dual Digitally Programmable Potentiometers (DPP™) with 256 Taps and SPI Interface
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CAT5261
D.C. OPERATING CHARACTERISTICS
VCC = +2.5V to +6.0V, unless otherwise specified.
Symbol Parameter
Test Conditions
Min
ICC1
Power Supply Current
Power Supply Current
ICC2
Non-volatile WRITE
ISB
Standby Current (VCC = 5.0V)
ILI
Input Leakage Current
fSCL = 400kHz, SDA = Open
VCC = 6V, Inputs = GNDs
fSCK = 400kHz, SDA Open
VCC = 6V, Input = GND
VIN = GND or VCC, SDA = Open
VIN = GND to VCC
ILO
Output Leakage Current
VOUT = GND to VCC
VIL
Input Low Voltage
-1
VIH
Input High Voltage
VCC x 0.7
VOL1 Output Low Voltage (VCC = 3.0V) IOL = 3mA
VOH1 Output High Voltage
IOH = -1.6mA
VCC – 0.8
PIN CAPACITANCE(1)
TA = 25ºC, f = 1.0MHz, VCC = 5V, unless otherwise specified.
Symbol
COUT(1)
CIN(1)
Test
Output Capacitance (SO)
Input Capacitance (¯C¯S¯, SCK, SI, ¯W¯P¯,H¯¯O¯L¯D¯, A0, A1)
Conditions
VOUT = 0V
VIN = 0V
Max
1
5
1
10
10
VCC x 0.3
VCC + 1.0
0.4
Max
8
6
A.C. CHARACTERISTICS
Symbol Parameter
Test Conditions
Min
Max
tSU
Data Setup Time
tH
Data Hold Time
tWH
SCK High Time
tWL
SCK Low Time
fSCK
Clock Frequency
tLZ
H¯¯O¯L¯D¯ to Output Low Z
tRI(1)
Input Rise Time
tFI(1)
Input Fall Time
tHD
H¯¯O¯L¯D¯ Setup Time
tCD
H¯¯O¯L¯D¯ Hold Time
CL = 50pF
50
50
125
125
DC
3
50
2
2
100
100
tV
Output Valid from Clock Low
tHO
Output Hold Time
200
0
tDIS
Output Disable Time
tHZ
H¯¯O¯L¯D¯ to Output High Z
tCS
¯C¯S¯ High Time
tCSS
¯C¯S¯ Setup Time
tCSH
¯C¯S¯ Hold Time
250
100
2
250
250
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
Units
mA
mA
µA
µA
µA
V
V
V
V
Units
pF
pF
Units
ns
ns
ns
ns
MHz
ns
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
© Catalyst Semiconductor, Inc.
5
Characteristics subject to change without notice
Doc. No. MD-2122 Rev. E
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