HCPL-1930 Datasheet, PDF (7/13 Pages) Agilent(Hewlett-Packard) – Dual Channel Line Receiver Dual Channel Line Receiver Dual Channel Line Receiver

HCPL-1930, HCPL-1931, HCPL-193K, 5962-89572
Data Sheet
Parameter
Symbol
Test Conditions
Group A
Limits
Subgroups^a _{Min Typ}b _Max
Unit Fig Note
Propagation Delay Time to Low
Output Level
Common Mode Transient Immunity
at High Output Level
Common Mode Transient Immunity
at Low Output Level
t_PHL
|CM_H|
|CM_L|
R_L = 510Ω; C_L = 50 pF,
I_I = 13 mA, V_CC = 5.0V
V_CM = 50V (peak),
V_O (min.) = 2V, R_L = 510Ω;
I_I = 0 mA, V_CC = 5.0V
V_CM = 50V (peak),
V_O (max.) = 0.8V,
R_L = 510Ω; I_I = 10 mA,
V_CC = 5.0V
9
10, 11
9, 10, 11
9, 10, 11
—
60
100
—
—
120
1000 10,000 —
1000 10,000 —
ns 4, 5 ^{c, g}
V/μs 8, 9 ^{c, h, i}
V/μs 8, 9 ^{c, j, i}
a. Commercial parts receive 100% testing at 25°C (Subgroups 1 and 9). Class H and K parts receive 100% testing at 25, 125, and -55° C (Subgroups 1 and 9, 2 and
10, 3 and 11, respectively).
b. All typical values are at V_CC = 5V, T_A = 25°C.
c. Each channel.
d. No external pull-up is required for a high logic state on the enable input.
e. Device considered a two terminal device: pins 1 through 8 are shorted together, and pins 9 through 16 are shorted together.
f. The t_PLH propagation delay is measured from the 6.5-mA point on the trailing edge of the input pulse to the 1.5V point on the trailing edge of the output pulse.
g. The t_PHL propagation delay is measured from the 6.5-mA point on the leading edge of the input pulse to the 1.5V point on the leading edge of the output
pulse.
h. CM_H is the maximum tolerable rate of rise of the common mode voltage to assure that the output remains in a high logic state, i.e., V_OUT > 2.0V.
i. Parameters shall be tested as part of device initial characterization and after process changes. Parameters shall be guaranteed to the limits specified for all
lots not specifically tested.
j. CM_L is the maximum tolerable rate of fall of the common mode voltage to assure that the output remains in a low logic state, i.e., V_OUT < 0.8V.
Typical Specifications
T_A = 25°C, V_CC = 5V.
Parameter
Symbol Typ
Unit
Test Conditions
Fig. Note
Resistance (Input-Output)
R_I-O
Capacitance (Input-Output)
C_I-O
Input-Input Insulation Leakage Current
I_I-I
Resistance (Input-Input)
R_I-I
Capacitance (Input-Input)
C_I-I
Propagation Delay Time of Enable from V_EH to V_EL t_ELH
Propagation Delay Time of Enable from V_EL to V_EH t_EHL
Output Rise Time (10% to 90%)
t_r
Output Fall Time (90% to 10%)
t_f
Input Capacitance
C_I
10¹²
1.7
0.5
1012
0.55
35
35
30
24
60
Ω
V_I-O = 500 Vdc
a_, b
pF
f = 1 MHz
a, b
nA
≤65% Relative Humidity,
c
V_I-I = 500 Vdc, t = 5s
Ω
V_I-I = 500 Vdc
c
pF
f = 1 MHz
c
ns
R_L = 510Ω, C_L = 15 pF,
6, 7
a, d
ns
I_I = 13 mA, V_EH = 3V, V_EL = 0V
6, 7
a, e
ns
R_L = 510Ω, C_L = 15 pF, I_I = 13 mA
a
ns
a
pF f = 1 MHz, V_I = 0, PINS 1 to 2 or 5 to 6
a
a. Each channel.
b. Measured between pins 1 and 2 or 5 and 6 shorted together, and pins 10 through 15 shorted together.
c. Measured between adjacent input leads shorted together, i.e., between 1, 2, and 4 shorted together and pins 5, 6, and 8 shorted together.
d. The t_ELH enable propagation delay is measured from the 1.5V point on the trailing edge of the enable input pulse to the 1.5V point on the trailing edge of the
output pulse.
e. The t_EHL enable propagation delay is measured from the 1.5V point on the leading edge of the enable input pulse to the 1.5V point on the leading edge of
the output pulse.
Broadcom
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