HCPL-260L Datasheet, PDF (12/19 Pages) AVAGO TECHNOLOGIES LIMITED – High Speed LVTTL Compatible 3.3 Volt Optocouplers Low power consumption

Package Characteristics
All Typicals at T_A = 25˚C.
Parameter
Sym. Package
Min. Typ. Max Units Test Conditions
Fig.
Input-Output I_I-O* Single 8-Pin DIP
1
µA
45% RH, t = 5 s,
Insulation Single SO-8 V_I-O = 3 kV DC, T_A = 25˚C
Input-Output V_ISO 8-Pin DIP, SO-8
3750
V rms RH ≤ 50%, t = 1 min,
Momentary T_A = 25˚C
Withstand
Voltage**
Input-Output R_I-O
Resistance
8-Pin, SO-8
10¹²
Ω
V_I-O =500 V dc
Input-Output C_I-O
Capacitance
8-Pin DIP, SO-8
0.6
pF
f = 1 MHz, T_A = 25˚C
Input-Input
I_I-I
Dual Channel
0.005
µA
RH ≤ 45%, t = 5 s,
Insulation V_I-I = 500 V
Leakage
Current
Resistance
R_I-I
Dual Channel
10¹¹
Ω
(Input-Input)
Capacitance
C_I-I
(Input-Input)
Dual 8-Pin Dip
Dual SO-8
0.03
0.25
pG
f = 1 MHz
Note
16, 17
16, 17
1, 16, 19
1, 16, 19
20
20
20
*The JEDEC Registration specifies 0˚C to +70˚C. Avago specifies –40˚C to +85˚C.
**The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous
voltage rating. For the continuous voltage rating refer to the IEC/EN/DIN EN 60747-5-5 Insulation Characteristics Table (if applicable), your equip-
ment level safety specification or Avago Application Note 1074 entitled "Optocoupler Input-Output Endurance Voltage."
Notes:
1. Each channel.
2. Peaking circuits may produce transient input currents up to 50 mA, 50 ns maximum pulse width, provided average current does not
exceed 20 mA.
3. Peaking circuits may produce transient input currents up to 50 mA, 50 ns maximum pulse width, provided average current does not
exceed 15 mA.
4. Derate linearly above +80˚C free-air temperature at a rate of 2.7 mW/˚C for the SOIC-8 package.
5. Bypassing of the power supply line is required, with a 0.1 µF ceramic disc capacitor adjacent to each optocoupler as illustrated in
Figure 11. Total lead length between both ends of the capacitor and the isolator pins should not exceed 20 mm.
6. The t_PLH propagation delay is measured from the 3.75 mA point on the falling edge of the input pulse to the 1.5 V point on the rising edge
of the output pulse.
7. The t_PHL propagation delay is measured from the 3.75 mA point on the rising edge of the input pulse to the 1.5 V point on the falling edge
of the output pulse.
8. t_PSK is equal to the worst case difference in t_PHL and/or t_PLH that will be seen between units at any given temperature and specified test
conditions.
9. See test circuit for measurement details.
10. The t_ELH enable propagation delay is measured from the 1.5 V point on the falling edge of the enable input pulse to the 1.5 V point on the
rising edge of the output pulse.
11. The t_EHL enable propagation delay is measured from the 1.5 V point on the rising edge of the enable input pulse to the 1.5 V point on the
falling edge of the output pulse.
12. CM_H is the maximum tolerable rate of rise on the common mode voltage to assure that the output will remain in a high logic state
(i.e., V_o > 2.0 V).
13. CM_L is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state
(i.e., V_o < 0.8 V).
14. For sinusoidal voltages, (|dV_CM | / dt)_max = πf_CMV_CM (p-p).
15. No external pull up is required for a high logic state on the enable input. If the V_E pin is not used, tying V_E to V_CC will result in improved
CMR performance. For single channel products only. See application information provided.
16. Device considered a two-terminal device: pins 1, 2, 3, and 4 shorted together, and pins 5, 6, 7, and 8 shorted together.
17. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 4500 V rms for one second (leakage
detection current limit, I_I-O ≤ 5 µA). This test is performed before the 100% production test for partial discharge (Method b) shown in the IEC/
EN/DIN EN 60747-5-5 Insulation Characteristics Table, if applicable.
18. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 6000 V rms for one second (leakage
detection current limit, I_I-O ≤ 5 µA). This test is performed before the 100% production test for partial discharge (Method b) shown in the IEC/
EN/DIN EN 60747-5-5 Insulation Characteristics Table, if applicable.
19. Measured between the LED anode and cathode shorted together and pins 5 through 8 shorted together. For dual channel products only.
20. Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. For dual channel products only.
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