AMIS-42700 Datasheet, PDF (11/16 Pages) AMI SEMICONDUCTOR – Dual High-Speed CAN Transceiver

AMIS-42700 Dual High-Speed CAN Transceiver
Preliminary Data Sheet
Table 4: DC Characteristics (Continued)
Symbol
Parameter
Bus Lines (pins CANH and CANL)
I_LI(CANL)
Input leakage current at pin CANL
V_CM-peak
Common-mode peak during transition from
dom → rec or rec → dom
V_CM-step
Difference in common-mode between dominant
and recessive state
Power-on-Reset
PORL
POR level
Thermal Shutdown
T_j(sd)
Shutdown junction temperature
Timing Characteristics (see Figure 6 and 7)
t_d(TxD-BUSon)
Delay TxD to bus active
t_{d(TxD-BUSoff)}
Delay TxD to bus inactive
t_d(BUSon-RXD)
Delay bus active to RxD
t_{d(BUSoff-RXD)}
Delay bus inactive to RxD
t_pd(rec-dom)
Propagation delay TxD to RxD from recessive
to dominant
t_d(dom-rec)
Propagation delay TxD to RxD from dominant
to recessive
t_dom(TXD)
TXD dominant time for time out
Conditions
V_CC =0V; V_CANL = 5V
See Figure 8 and 9
See Figure 8 and 9
CANH, CANL, V_ref in tri-
state below POR level
V_s = 0V
V_s = 0V
V_s = 0V
V_s = 0V
V_s = 0V
V_s = 0V
V_TxD = 0V
Min.
10
-500
-150
2.2
140
40
30
25
65
70
100
250
Typ.
170
3.5
160
85
60
55
100
450
Max.
250
500
150
4.7
190
130
105
105
155
230
245
750
Unit
µA
mV
mV
V
°C
ns
ns
ns
ns
ns
ns
µs
8.5 Measurement Setups and Definitions
Schematics are given for single CAN transceiver.
+5V
100 nF
VCC
Vref
Text
12
3
8 ₁₃ CANH1
CANL1
Rint
14
Tx0
9 _AMIS-42700
CANH2
19
4
Rx0 7
18 ^CANL2
10 2 17 16 15 6 5
1 nF
1 nF
EN1 EN2
GND
PC20050502.5
Transient
Generator
Figure 4: Test Circuit for Automotive Transients
V_RxD
PC20040829.7
0,5
Hysteresis
0,9
High
Low
V_i(dif)(hys)
Figure 5: Hysteresis of the Receiver
AMI Semiconductor – Rev. 1.4, May 05 - Preliminary
www.amis.com
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