AK2573A Datasheet, PDF (6/38 Pages) Asahi Kasei Microsystems – 125M / 156M Laser Diode Driver + APC

ASAHI KASEI
[AK2573A]
Ⅱ. Absolute Maximum Rating
Item
Symbol
Min
Max
Unit
Supply Voltage
VDD
-0.3
6.0
V
GND
VSS
0.0
0.0
V
Input voltage
VIN
-0.3
VDD + 0.3 V
Input Current
IIN
-10
10
mA
Storage Temperature
TSTG
-55
130
°C
Stress beyond “Absolute Maximum Range” may cause permanent damage to the device.
Note1: ExceptDataretention. Dataretentionisprescribedatsection-Ⅳ(2)EEPROM.
Remarks
Reference Voltage
Except VDD
Except VDD
Note 1
Ⅲ. Recommended Operation Conditions
Item
Symbol
Min
Typ
Max Unit
Remarks
Operating Ambient
Ta1
-40
85
°C
Power Supply
VDD1
3.1
3.3
3.5
V
Except AVDD
VDD2
3.0
3.3
3.5
V
AVDD
VSS
0.0
0.0
0.0
V Reference Voltage
Ⅳ. Electrical Characteristics
1. Power Consumption
Item
Symbol min
typ
max Unit
Remarks
Supply Current 1 (All VDD)
IDD1
-
7.8
9.4
mA Note 1, 2, 3
Supply Current 2 (All VDD)
IDD2
15
20
mA Note 1, 2, 4
Supply Current 3 (AVDD only) IDD3
-
-
5
mA Note 1, 5
Note 1: without BIAS and modulation current
Note 2: I-DAC1 = 0, I-DAC2 = 0, Gain = 1, PDGAIN = 0dB, PDIN = 1V
Note 3: DATAP = CLKP = “L”, DATAN =CLKN = “H”
Note 4: 155.52Mbps, PN7
Note 5: I-DAC1 = I-DAC2 = FFh (Full code), Gain = 1, PDGAIN = 0dB, PDIN = 1V
2. EEPROM
Item
min
max
Unit
Remarks
Endurance
Data retention
10000
10
-
Write Cycle Note 1
-
Year Junction Temperature = 85℃
Note 1: This parameter is characterized and is not 100% tested.
Important Notice: The AKM factory adjusted data are stored in advance at address location (Device Address = A6h,
Address = 60h) for the offset of the on-chip temperature sensor. If such excess temperature stress is to be applied to
the AK2573A which exceeds a guaranteed EEPROM data retention conditions (for 10 years at 85C), it is important to
read the pre-determined value in advamce and to re-write the same data back into EEPROM after an exposure to the
excess temperature environment. Even if the exposure time is shorter than the retention time, any accelerated
temperature stress tests (such as baking) are performed, it is recommended to read the pre-set data first and to
re-write it after the test. Access to un-used address locations is not functionally guaranteed.
Refer to section-Ⅵ 8.3 for EEPROM map.
<MS0189-E-01>
-6-
2004/5