5962-8770102RA Datasheet, PDF (3/8 Pages) Analog Devices – CMOS Dual 8-Bit Buffered Multiplying DAC

AD7528
Parameter
CHANNEL-TO-CHANNEL ISOLATION
VREF A to OUT B
VREF B to OUT A
DIGITAL CROSSTALK
VDD = +5 V
VDD = +15 V
Version¹ TA = +25°C TMIN, TMAX TA= +25°C TMIN, TMAX Units
All
–77
–77
–77
dB typ
–77
dB typ
All
30
60
nV sec typ
Test Conditions/Comments
Both DAC Latches Loaded with 11111111.
VREF A = 20 V p-p Sine Wave @ 100 kHz
VREF B = 0 V see Figure 6.
V_REF A = 20 V p-p Sine Wave @ 100 kHz
VREF A = 0 V see Figure 6.
Measured for Code Transition 00000000 to
11111111
HARMONIC DISTORTlON
All
–85
NOTES
1_{Temperature Ranges are J, K, L Versions: –40°C to +85°C}
A, B, C Versions: –40°C to +85°C
S, T, U Versions: –55°C to +125°C
2_{Specifications applies to both DACs in AD7528.}
3_{Guaranteed by design but not production tested.}
4_{Logic inputs are MOS Gates. Typical input current (+25°C) is less than 1 nA.}
5_{These characteristics are for design guidance only and are not subject to test.}
6_{Feedthrough can be further reduced by connecting the metal lid on the ceramic package}
(suffix D) to DGND.
Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS
(TA = +25°C unless otherwise noted)
V_DD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
V_DD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . V_DD + 0.3 V
DGND to AGND . . . . . . . . . . . . . . . . . . . . . . . . V_DD + 0.3 V
Digital Input Voltage to DGND . . . . . . . –0.3 V, V_DD + 0.3 V
V_PIN2, V_PIN20 to AGND . . . . . . . . . . . . . . –0.3 V, V_DD + 0.3 V
V_REF A, V_REF B to AGND . . . . . . . . . . . . . . . . . . . . . . . ± 25 V
V_RFB A, V_RFB B to AGND . . . . . . . . . . . . . . . . . . . . . . . ± 25 V
Power Dissipation (Any Package) to +75°C . . . . . . . 450 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . 6 mW/°C
Operating Temperature Range
Commercial (J, K, L) Grades . . . . . . . . . . . –40°C to +85°C
Industrial (A, B, C) Grades . . . . . . . . . . . . –40°C to +85°C
Extended (S, T, U) Grades . . . . . . . . . . . –55°C to +125°C
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . +300°C
–85
dB typ
VIN = 6 V rms @ 1 kHz
AD7528, ideal maximum output is V_REF – 1 LSB. Gain error of
both DACs is adjustable to zero with external resistance.
Output Capacitance
Capacitance from OUT A or OUT B to AGND.
Digital to Analog Glitch lmpulse
The amount of charge injected from the digital inputs to the
analog output when the inputs change state. This is normally
specified as the area of the glitch in either pA-secs or nV-secs
depending upon whether the glitch is measured as a current or
voltage signal. Glitch impulse is measured with V_REF A,
V_REF B = AGND.
Propagation Delay
This is a measure of the internal delays of the circuit and is
defined as the time from a digital input change to the analog
output current reaching 90% of its final value.
Channel-to-Channel Isolation
The proportion of input signal from one DAC’s reference input
which appears at the output of the other DAC, expressed as a
ratio in dB.
Digital Crosstalk
The glitch energy transferred to the output of one converter due
to a change in digital input code to the other converter. Speci-
fied in nV secs.
CAUTION:
1. ESD sensitive device. The digital control inputs are diode
protected; however, permanent damage may occur on uncon-
nected devices subjected to high energy electrostatic fields.
Unused devices must be stored in conductive foam or shunts.
2. Do not insert this device into powered sockets. Remove
power before insertion or removal.
TERMINOLOGY
Relative Accuracy
Relative accuracy or endpoint nonlinearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero and full scale and is normally expressed in
LSBs or as a percentage of full scale reading.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ± 1 LSB max over
the operating temperature range ensures monotonicity.
Gain Error
Gain error or full-scale error is a measure of the output error
between an ideal DAC and the actual device output. For the
PIN CONFIGURATIONS
PLCC
V_REF A 4
DGND 5
DAC A/DAC B ⁶
(MSB) DB7 7
DB6 8
3 2 1 20 19
PIN 1
IDENTIFIER
AD7528
TOP VIEW
(Not to Scale)
18 V_REF B
17 V_DD
16 _WR
15 _CS
14 DB0 (LSB)
9 10 11 12 13
DIP, SOIC
AGND 1
20 OUT B
OUT A 2
19 R_FB B
R_FB A 3
18 V_REF B
V_REF A 4
17 V_DD
DGND 5 AD7528 16 WR
DAC A/DAC B
6
TOP VIEW _{15 CS}
(Not to Scale)
(MSB) DB7 7
14 DB0 (LSB)
DB6 8
13 DB1
DB5 9
12 DB2
DB4 10
11 _DB3
REV. B
–3–