5962-89481022A Datasheet, PDF (2/8 Pages) Analog Devices – CMOS 12-Bit Monolithic Multiplying DAC

AD7541A–SPECIFICATIONS (VDD = +15 V, VREF = +10 V; OUT 1 = OUT 2 = GND = 0 V unless otherwise noted)
Parameter
T_A =
Version +25؇C
T_A =
T_MIN, T_MAX1
Units
Test Conditions/Comments
ACCURACY
Resolution
Relative Accuracy
Differential Nonlinearity
Gain Error
Gain Temperature Coefficient²
⌬Gain/⌬Temperature
Output Leakage Current
OUT1 (Pin 1)
OUT2 (Pin 2)
All
12
J, A, S
±1
K, B, T ± 1/2
J, A, S
±1
K, B, T ± 1/2
J, A, S
±6
K, B, T ± 3
All
5
J, K
±5
A, B
±5
S, T
±5
J, K
±5
A, B
±5
S, T
±5
12
±1
± 1/2
±1
± 1/2
±8
±5
5
± 10
± 10
± 200
± 10
± 10
± 200
Bits
LSB max
LSB max
LSB max
LSB max
LSB max
LSB max
ppm/°C max
nA max
nA max
nA max
nA max
nA max
nA max
± 1 LSB = ±0.024% of Full Scale
± 1/2 LSB = ± 0.012% of Full Scale
All Grades Guaranteed Monotonic
to 12 Bits, T_MIN to T_MAX.
Measured Using Internal R_FB and Includes
Effect of Leakage Current and Gain TC.
Gain Error Can Be Trimmed to Zero.
Typical Value Is 2 ppm/°C.
All Digital Inputs = 0 V.
All Digital Inputs = V_DD.
REFERENCE INPUT
Input Resistance (Pin 17 to GND)
All
7–18
7–18
kΩ min/max
Typical Input Resistance = 11 kΩ.
Typical Input Resistance Temperature
Coefficient = –300 ppm/°C.
DIGITAL INPUTS
V_IH (Input HIGH Voltage)
V_IL (Input LOW Voltage)
I_IN (Input Current)
CIN (Input Capacitance)²
POWER SUPPLY REJECTION
⌬Gain/⌬VDD
POWER SUPPLY
V_DD Range
I_DD
All
2.4
2.4
All
0.8
0.8
All
±1
±1
All
8
8
V min
V max
µA max
pF max
Logic Inputs Are MOS Gates. IIN typ (25°C) = 1 nA.
VIN = 0 V
All
± 0.01
± 0.02
% per % max ⌬VDD = ± 5%
All
+5 to +16 +5 to +16 V min/V max Accuracy Is Not Guaranteed Over This Range.
All
2
2
100
500
mA max
µA max
All Digital Inputs VIL or VIH.
All Digital Inputs 0 V or VDD.
AC PERFORMANCE CHARACTERISTICS
These Characteristics are included for Design Guidance only and are not subject to test. V_DD = +15 V, V_IN = +10 V except where noted,
OUT1 = 0UT2 = GND = 0 V, Output Amp is AD544 except where noted.
Parameter
T_A =
Version¹ +25؇C
T_A =
T_MIN, T_MAX1
Units
Test Conditions/Comments
PROPAGATION DELAY (From Digital Input
Change to 90% of Final Analog Output)
All
DIGITAL TO ANALOG GLITCH
IMPULSE
All
100
—
1000
—
ns typ
nV-sec typ
OUT 1 Load = 100 Ω, C_EXT = 13 pF.
Digital Inputs = 0 V to V_DD or V_DD to 0 V.
V_REF = 0 V. All digital inputs 0 V to V_DD or
V_DD to 0 V.
Measured using Model 50K as output amplifier.
MULTIPLYING FEEDTHROUGH ERROR³
(V_REF to OUT1)
All
1.0
—
mV p-p typ V_REF = ± 10 V, 10 kHz sine wave.
OUTPUT CURRENT SETTLING TIME
All
OUTPUT CAPACITANCE
C_OUT1 (Pin 1)
All
C_OUT2 (Pin 2)
All
C_OUT1 (Pin 1)
All
C_OUT2 (Pin 2)
All
0.6
—
200
200
70
70
70
70
200
200
µs typ
pF max
pF max
pF max
pF max
To 0.01% of full-scale range.
OUT 1 Load = 100 Ω, C_EXT = 13 pF.
Digital Inputs = 0 V to V_DD or V_DD to 0 V.
Digital Inputs
= V_IH
Digital Inputs
= V_IL
NOTES
1_{Temperature range as follows: J, K versions, 0°C to +70°C; A, B versions, –25°C to +85°C; S, T versions, –55°C to +125°C.}
2_{Guaranteed by design but not production tested.}
3_{To minimize feedthrough in the ceramic package (Suffix D) the user must ground the metal lid.}
Specifications subject to change without notice.
–2–
REV. B