AC0603FR Datasheet, PDF (7/10 Pages) YAGEO Corporation – THICK FILM CHIP RESISTORS Automotive grade

Chip Resistor Surface Mount ^{AC SERIES 0402 to 2512}
Product specification 7
10
TESTS AND REQUIREMENTS
Table 4 Test condition, procedure and requirements
TEST
TEST METHOD
PROCEDURE
High Temperature AEC-Q200 Test 3
Exposure
MIL-STD-202 Method 108
1,000 hours at TA = 125 °C, unpowered
REQUIREMENTS
±(1.0%+0.05 Ω)
<50 mΩ for Jumper
Moisture
Resistance
AEC-Q200 Test 6
MIL-STD-202 Method 106
Each temperature / humidity cycle is defined at
8 hours (method 106F), 3 cycles / 24 hours for
10d. with 25 °C / 65 °C 95% R.H, without steps
7a & 7b, unpowered
Parts mounted on test-boards, without
condensation on parts
±(0.5%+0.05 Ω) for 1% tol.
±(2.0%+0.05 Ω) for 5% tol.
<100 mΩ for Jumper
Biased
Humidity
AEC-Q200 Test 7
MIL-STD-202 Method 103
1,000 hours; 85 °C / 85% RH
10% of operating power
Measurement at 24±4 hours after test conclusion.
±(1.0%+0.05 Ω)
<100 mΩ for Jumper
Operational Life
AEC-Q200 Test 8
MIL-STD-202 Method 108
1,000 hours at 125 °C, derated voltage applied for ±(1.0%+0.05 Ω)
1.5 hours on, 0.5 hour off, still-air required
<100 mΩ for Jumper
Resistance to
Soldering Heat
AEC-Q200 Test 15
MIL-STD-202 Method 210
Condition B, no pre-heat of samples
Lead-free solder, 260±5 °C, 10±1 seconds
immersion time
Procedure 2 for SMD: devices fluxed and
cleaned with isopropanol
±(0.5%+0.05 Ω) for 1% tol.
±(1.0%+0.05 Ω) for 5% tol.
<50 mΩ for Jumper
No visible damage
Thermal Shock
AEC-Q200 Test 16
MIL-STD-202 Method 107
-55/+125 °C
Number of cycles is 300. Devices mounted
Maximum transfer time is 20 seconds.
Dwell time is 15 minutes. Air – Air
±(1.0%+0.05 Ω)
<50 mΩ for Jumper
ESD
AEC-Q200 Test 17
Human Body Model,
±(3.0%+0.05 Ω)
AEC-Q200-002
1 pos. + 1 neg. discharges 0402/0603: 1 KV,
0805 and above: 2 KV
<50 mΩ for Jumper
Feb 10, 2012 V.2
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