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DS187 Datasheet, PDF (19/72 Pages) Xilinx, Inc – Zynq-7000 All Programmable SoC
Zynq-7000 All Programmable SoC (Z-7007S, Z-7012S, Z-7014S, Z-7010, Z-7015, and Z-7020)
Table 28: DDR3L Interface Switching Characteristics (800 Mb/s)(1) (Cont’d)
Symbol
Description
Min
Max Units
TCKCA(6)
Command/address output hold time with respect to CLK
853
–
ps
Notes:
1. Recommended VCCO_DDR = 1.35V ±5%.
2. Measurement is taken from VREF to VREF.
3. Measurement is taken from either the rising edge of DQ that crosses VIH(AC) or the falling edge of DQ that crosses VIL(AC) to VREF of DQS.
4. Measurement is taken from either the rising edge of DQ that crosses VIL(DC) or the falling edge of DQ that crosses VIH(DC) to VREF of DQS.
5. Measurement is taken from either the rising edge of CMD/ADDR that crosses VIH(AC) or the falling edge of CMD/ADDR that crosses
VIL(AC) to VREF of CLK.
6. Measurement is taken from either the rising edge of CMD/ADDR that crosses VIL(DC) or the falling edge of CMD/ADDR that crosses
VIH(DC) to VREF of CLK.
Table 29: LPDDR2 Interface Switching Characteristics (800 Mb/s)(1)
Symbol
Description
Min
Max Units
TDQVALID(2)
TDQDS(3)
TDQDH(4)
Input data valid window
Output DQ to DQS skew
Output DQS to DQ skew
500
–
ps
196
–
ps
328
–
ps
TDQSS
TCACK(5)
TCKCA(6)
Output clock to DQS skew
Command/address output setup time with respect to CLK
Command/address output hold time with respect to CLK
0.90
202
353
1.06
TCK
–
ps
–
ps
Notes:
1. Recommended VCCO_DDR = 1.2V ±5%.
2. Measurement is taken from VREF to VREF.
3. Measurement is taken from either the rising edge of DQ that crosses VIH(AC) or the falling edge of DQ that crosses VIL(AC) to VREF of DQS.
4. Measurement is taken from either the rising edge of DQ that crosses VIL(DC) or the falling edge of DQ that crosses VIH(DC) to VREF of DQS.
5. Measurement is taken from either the rising edge of CMD/ADDR that crosses VIH(AC) or the falling edge of CMD/ADDR that crosses VIL(AC)
to VREF of CLK.
6. Measurement is taken from either the rising edge of CMD/ADDR that crosses VIL(DC) or the falling edge of CMD/ADDR that crosses
VIH(DC) to VREF of CLK.
Table 30: LPDDR2 Interface Switching Characteristics (400 Mb/s)(1)
Symbol
Description
Min
Max Units
TDQVALID(2)
TDQDS(3)
TDQDH(4)
Input data valid window
Output DQ to DQS skew
Output DQS to DQ skew
500
–
ps
664
–
ps
766
–
ps
TDQSS
TCACK(5)
TCKCA(6)
Output clock to DQS skew
Command/address output setup time with respect to CLK
Command/address output hold time with respect to CLK
0.90
731
907
1.06
TCK
–
ps
–
ps
Notes:
1. Recommended VCCO_DDR = 1.2V ±5%.
2. Measurement is taken from VREF to VREF.
3. Measurement is taken from either the rising edge of DQ that crosses VIH(AC) or the falling edge of DQ that crosses VIL(AC) to VREF of DQS.
4. Measurement is taken from either the rising edge of DQ that crosses VIL(DC) or the falling edge of DQ that crosses VIH(DC) to VREF of DQS.
5. Measurement is taken from either the rising edge of CMD/ADDR that crosses VIH(AC) or the falling edge of CMD/ADDR that crosses VIL(AC)
to VREF of CLK.
6. Measurement is taken from either the rising edge of CMD/ADDR that crosses VIL(DC) or the falling edge of CMD/ADDR that crosses
VIH(DC) to VREF of CLK.
DS187 (v1.19) October 3, 2016
Product Specification
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