X68257 Datasheet, PDF (8/14 Pages) Xicor Inc. – E2 Micro-Peripheral

X68257
A.C. CONDITIONS OF TEST
Input Pulse Levels
Input Rise and
Fall Times
Input and Output
Timing Levels
0V to 3V
10ns
1.5V
6539 PGM T08.1
TEST CIRCUIT
5V
1.92KΩ
OUTPUT
1.37KΩ
100pF
6539 FHD F04.2
A.C. CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
E Controlled Read Cycle
Symbol
Parameter
Min.
Max.
Units
PWASH
t_ASL
tAHL
tACC
t_DHR
tCSL
PWEH
t_ES
tEH
tRWS
t_HZ(3)
tLZ(3)
Address Strobe Pulse Width
Address Setup Time
Address Hold Time
Data Access Time
Data Hold Time
CE Setup Time
E Pulse Width
Enable Setup Time
E Hold Time
R/W Setup Time
E LOW to High Z Output
E HIGH to Low Z Output
E Controlled Read Cycle
80
ns
20
ns
30
ns
120
ns
0
ns
7
ns
150
ns
30
ns
20
ns
20
ns
50
ns
0
ns
6539 PGM T09.1
CE
AS
A/D0–A/D7
PWASH
tASL
tCSL
tES
tAHL
AIN
A8–A14
A8–A14
R/W
tRWS
E
tEH
tEH
tACC
DOUT
tDHR
tHZ
tEH
PWEH
Note: (3) This parameter is periodically sampled and not 100% tested.
8
6539 FHD F05.2