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WCFS4016V1C Datasheet, PDF (4/9 Pages) Weida Semiconductor, Inc. – 256K x 16 Static RAM
WCFS4016V1C
AC Switching Characteristics[3] Over the Operating Range
Parameter
READ CYCLE
tpower[4]
tRC
tAA
tOHA
tACE
tDOE
tLZOE
tHZOE
tLZCE
tHZCE
tPU
tPD
tDBE
tLZBE
tHZBE
WRITE CYCLE[7, 8]
tWC
tSCE
tAW
tHA
tSA
tPWE
tSD
tHD
tLZWE
tHZWE
tBW
Description
VCC(typical) to the first access
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low Z
OE HIGH to High Z[5, 6]
CE LOW to Low Z[6]
CE HIGH to High Z[5, 6]
CE LOW to Power-Up
CE HIGH to Power-Down
Byte Enable to Data Valid
Byte Enable to Low Z
Byte Disable to High Z
Write Cycle Time
CE LOW to Write End
Address Set-Up to Write End
Address Hold from Write End
Address Set-Up to Write Start
WE Pulse Width
Data Set-Up to Write End
Data Hold from Write End
WE HIGH to Low Z[6]
WE LOW to High Z[5, 6]
Byte Enable to End of Write
WCFS4016V1C 12ns
Min.
Max.
Unit
1
µs
12
ns
12
ns
3
ns
12
ns
6
ns
0
ns
6
ns
3
ns
6
ns
0
ns
12
ns
6
ns
0
ns
6
ns
12
ns
8
ns
8
ns
0
ns
0
ns
8
ns
6
ns
0
ns
3
ns
6
ns
8
ns
Notes:
3. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V.
4. tPOWER gives the minimum amount of time that the power supply should be at typical Vcc values until the first memory access can be performed.
5. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5pF as in part (a) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
7. The internal write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either of
these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
8. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
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