WCMS0808U1X Datasheet, PDF (2/10 Pages) Weida Semiconductor, Inc. – 32K x 8 Static RAM

WCMS0808U1X
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ..................................... −65°C to +150°C
Ambient Temperature with
Power Applied................................................... 0°C to +70°C
Supply Voltage to Ground Potential
(Pin 28 to Pin 14).................................................−0.5V to +4.6V
DC Voltage Applied to Outputs
in High Z State^[1]........................................ −0.5V to V_CC + 0.5V
Product Portfolio
DC Input Voltage^[1].................................... −0.5V to V_CC + 0.5V
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current.................................................... >200 mA
Operating Range
Range
Industrial
Ambient Temperature
−40°C to +85°C
V_CC
2.7V to 3.6V
Product
WCMS0808U1X
Min.
2.7V
V_CC Range
Typ.
3.0
Max.
3.6V
Speed
70 ns
Power Dissipation (LL Devices)
Operating (I_CC)
Typ.
Max.
Standby (I_SB2)
Typ.
Max.
11 mA
30 mA
0.1 µA
40 µA
Electrical Characteristics Over the Operating Range
Parameter
Description
V_OH
Output HIGH Voltage
V_OL
Output LOW Voltage
V_IH
Input HIGH Voltage
Test Conditions
V_CC = Min., I_OH = −1.0 mA
V_CC = Min., I_OL = 2.1 mA
V_IL
Input LOW Voltage
I_IX
Input Leakage Current
GND < V_I < V_CC
I_OZ
Output Leakage Current
GND < V_O < V_CC, Output Disabled
I_CC
V_CC Operating Supply
V_CC = 3.6V,
Ind’l
Current
I_OUT = 0 mA,
f = f_MAX = 1/t_RC
I_SB1
Automatic CE Power-Down Max. V_CC, CE > V_IH,
Ind’l
Current— TTL Inputs
V_IN > V_IH or V_IN < V_IL, f = f_MAX
I_SB2
Automatic CE
Max. V_CC, CE > V_CC – 0.3V
Ind’l
Power-Down Current—
V_IN > V_CC – 0.3V or V_IN < 0.3V, f = 0
CMOS Inputs
WCMS0808U1X
Min. Typ.^[1] Max. Unit
2.4
V
0.4
V
2.2
V_CC
V
+0.3V
−0.5
0.8
V
−1
+1 µA
−1
+1 µA
11
30 mA
100 300 µA
0.1
40
µA
Capacitance^[3]
Parameter
Description
Test Conditions
Max.
Unit
C_IN
C_OUT
Input Capacitance
Output Capacitance
T_A = 25°C, f = 1 MHz,
V_CC = 3.0V
6
pF
8
pF
Notes:
1. V_IL (min.) = –2.0V for pulse durations of less than 20 ns.
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V_CC = Vcc Typ., T_A = 25°C, and t_AA=70ns.
3. Tested initially and after any design or process changes that may affect these parameters.
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