DG4051A Datasheet, PDF (6/14 Pages) Vishay Siliconix – 8-Channel, Dual 4-Channel, Triple 2-Channel Multiplexers, with 0.5 pC Charge Injection

New Product
DG4051A/DG4052A/DG4053A
Vishay Siliconix
SPECIFICATIONS FOR UNIPOLAR SUPPLIES
Parameter
Analog Switch
Symbol
Test Conditions
Unless Otherwise Specified
V_CC = + 3 V, V_EE = 0 V
V_{IN(A, B, C and ENABLE)} = 1.4 V, 0.6 V^a _Temp.^b
Analog Signal Range^e
V_ANALOG
Full
On-Resistance
R_ON
I_S = 1 mA, V_D = 1.5 V
Room
Full
Switch Off
Leakage Current
I_S(off)
I_D(off)
V+ = + 3.3 V, V- = 0 V
V_D = 0.3 V/3.0 V, V_S = 3.0 V/0.3 V
Room
Full
Room
Full
Channel On
Leakage Current
Digital Control
I_D(on)
V+ = + 3.3 V, V- = 0 V
V_D = V_S = 0.3 V/3.0 V
Room
Full
Input Current, V_IN Low
I_L
V_{IN(A, B, C and ENABLE)}
Under Test = 0.6 V
Full
Input Current, V_IN High
I_H
V_{IN(A, B, C and ENABLE)}
Under Test = 1.4 V
Full
Dynamic Characteristics
Transition Time
t_TRANS
Room
Full
Enable Turn-On Time
t_ON
Enable Turn-Off Time
t_OFF
R_L = 300 Ω, C_L = 35 pF
See Figure 1, 2, 3
Room
Full
Room
Full
Break-Before-Make
Time Delay
Charge Injection^e
Off Isolation^e
Channel-to-Channel
Crosstalk^e
t_D
Q
OIRR
X_TALK
V_g = 0 V, R_g = 0 Ω, C_L = 1 nF
R_L = 50 Ω, C_L = 1 pF
f = 100 kHz
Room
Full
Room
Room
Room
Power Supplies
Power Supply Current
I+
Room
Full
Negative Supply Current
I-
V_{IN(A, B, C and ENABLE)} = 0 or 3 V
Room
Full
Ground Current
I_GND
Room
Full
Typ.^c
175
± 0.02
± 0.02
± 0.02
0.01
0.01
81
71
69
23
0.5
< - 90
< - 90
0.05
- 0.05
- 0.05
- 40 to 125 °C
Min.^d Max.^d
0
3
265
310
-1
1
- 50
50
-1
1
- 50
50
-1
1
- 50
50
-1
1
-1
1
172
218
151
183
138
161
5
1
10
-1
- 10
-1
- 10
- 40 to 85 °C
Min.^d Max.^d
0
3
265
298
-1
1
-5
5
-1
1
-5
5
-1
1
-5
5
-1
1
-1
1
172
194
151
167
138
151
5
1
10
-1
- 10
-1
- 10
Unit
V
Ω
nA
µA
ns
pC
dB
µA
Notes:
a. V_IN = input voltage to perform proper function.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 69828
S-80839-Rev. B, 21-Apr-08