CHPFR Datasheet, PDF (6/7 Pages) Vishay Siliconix – ESCC ( ) 4001/026 Qualified R Failure RateHigh Precision Thick Film Chip Resistors

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CHPFR
Vishay Sfernice
TRACEABILITY DEFINITIONS
The two major traceability elements are defined as:
• The primary process lot number named Front End lot (FE lot). One “FE lot”is composed of several wafers issued from the
same thin film deposition sequence.
• The date code named Batch Number(BN). The “BN” is defined after completion of the end of production testing sequence.
The lot homogeneity is given by the “FE lot” and not by the “BN”.
According to the applied rules validated by the ESCC through the product qualification, the following situations are agreed:
• Parts coming from different “FE lost” might have the same “BN”.
• A maximum of two different “BN” might be applied to the same “FE lot” to enable the use of overruns from a previous PO.
• Unless requested / approved by the customer the “BN” will be 2 years old maximum.
SPECIFIC TRACEABILITY REQUIREMENTS
The following specific requirements have to be treated as:
• A customer who requires “Lot Homogeneity” has to mention it on the PO as “SINGLE PRODUCTION LOT”.
• A customer who requires “Lot Homogeneity” in addition to a “Single Batch Number” has to mention it on the PO as “SINGLE
PRODUCTION LOT AND OPTION R0101”.
END OF PRODUCTION TESTING
Mandatory testing performed at the end of the production process:
• 100 % overload: Voltage 6.25 P_n x R_n or 2 U_L whichever is less - duration 2 s
Revision: 19-Nov-14
6
Document Number: 52033
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