140CLH_08 Datasheet, PDF (6/7 Pages) Vishay Siliconix – Aluminum Capacitors SMD (Chip), High Temperature

140 CLH
Vishay BCcomponents
Aluminum Capacitors
SMD (Chip), High Temperature
Table 6
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
Mounting
IEC 60384-18,
subclause 4.3
shall be performed prior to tests mentioned below;
reflow soldering;
for maximum temperature load
refer to chapter “Mounting”
Endurance
IEC 60384-18/
CECC 32 300,
subclause 4.15
T_amb = 125 °C; U_R applied;
1000 hours
REQUIREMENTS
ΔC/C: ± 5 %
tan δ ≤ spec. limit
I_L2 ≤ spec. limit
U_R = 6.3 V; ΔC/C: ± 25 %
U_R ≥ 10 V; ΔC/C: ± 20 %
tan δ ≤ 2 x spec. limit
Useful life
CECC 30301,
subclause 1.8.1
T_amb = 125 °C; U_R and I_R applied;
1500 hours
I_L2 ≤ spec. limit
ΔC/C: ± 50 %
tan δ ≤ 3 x spec. limit
I_L2 ≤ spec. limit
no short or open circuit
Shelf life
(storage at high
temperature)
IEC 60384-18/
CECC 32 300,
subclause 4.17
Reverse voltage
IEC 60384-18/
CECC 32 300,
subclause 4.16
T_amb = 125 °C; no voltage applied;
1000 hours
after test: U_R to be applied for 30 minutes,
24 to 48 hours before measurement
T_amb = 125 °C:
125 hours at U = - 0.5 V,
followed by 125 hours at U_R
total failure percentage: ≤ 1 %
for requirements
see ‘Endurance test’ above
ΔC/C: ± 15 %
tan δ ≤ 1.5 x spec. limit
I_L2 ≤ spec. limit
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Document Number: 28303
Revision: 29-May-08