DG417_08 Datasheet, PDF (4/11 Pages) Vishay Siliconix – Precision CMOS Analog Switches

DG417/418/419
Vishay Siliconix
SPECIFICATIONS^a
Parameter
Power Supplies
Positive Supply Current
Negative Supply Current
Logic Supply Current
Ground Current
Symbol
I+
I-
I_L
I_GND
Test Conditions
Unless Otherwise Specified
V+ = 15 V, V- = - 15 V
V_L = 5 V, V_IN = 2.4 V, 0.8 V^f
V+ = 16.5 V, V- = - 16.5 V
V_IN = 0 or 5 V
A Suffix
D Suffix
- 55 to 125 °C - 40 to 85 °C
Temp^b Typ^c Min^d Max^d Min^d Max^d Unit
Room 0.001
1
1
Full
5
5
Room - 0.001 - 1
-1
Full
-5
-5
µA
Room 0.001
1
1
Full
5
5
Room - 0.0001 - 1
-1
Full
-5
-5
SPECIFICATIONS FOR UNIPOLAR SUPPLIES^a
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
Parameter
Symbol
V_L = 5 V, V_IN = 2.4 V, 0.8 V^f
Analog Switch
A Suffix
D Suffix
- 55 to 125 °C - 40 to 85 °C
Temp^b Typ^c Min^d Max^d Min^d Max^d Unit
Analog Signal Range^e
Drain-Source
On-Resistance
V_ANALOG
r_DS(on)
I_S = - 10 mA, V_D = 3.8 V
V+ = 10.8 V
Full
Room 40
0
12
0
12 V
Ω
Dynamic Characteristics
Turn-On Time
t_ON
R_L = 300 Ω, C_L = 35 pF, V_S = 8 V Room 110
Turn-Off Time
t_OFF
See Switching Time Test Circuit Room 40
ns
Break-Before-Make
Time Delay
t_D
DG419 Only
R_L = 300 Ω, C_L = 35 pF
Room 60
Charge Injection
Q
C_L = 10 nF, V_gen = 0 V, R_gen = 0 Ω Room
5
pC
Power Supplies
Positive Supply
Current
I+
Room 0.001
Negative Supply
Current
Logic Supply
Current
I-
V+ = 13.2 V, V_L = 5.25 V
Room - 0.001
I_L
V_IN = 0 or 5 V
Room 0.001
µA
Ground
Current
I_GND
Room - 0.001
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. V_IN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 70051
S-71241–Rev. F, 25-Jun-07