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DG417B_08 Datasheet, PDF (4/10 Pages) Vishay Siliconix – Precision Monolithic Quad SPST CMOS Analog Switches
DG417B/418B/419B
Vishay Siliconix
SPECIFICATIONSa
Parameter
Source Off Capacitancee
Drain Off Capacitancee
Channel On Capacitancee
Power Supplies
Positive Supply Current
Negative Supply Current
Logic Supply Current
Ground Current
Symbol
CS(off)
CD(off)
CD(on)
I+
I-
IL
IGND
Test Conditions
Unless Otherwise Specified
V+ = 15 V, V- = - 15 V
VL = 5 V, VIN = 2.4 V, 0.8 Vf
f = 1 MHz, VS = 0 V
f = 1 MHz, VS = 0 V
DG417B
DG418B
DG417B
DG418B
DG419B
Tempb
Room
Room
Room
Room
Typc
12
12
50
57
A Suffix
D Suffix
- 55 to 125 °C - 40 to 85 °C
Mind Maxd Mind Maxd Unit
pF
V+ = 16.5 V, V- = - 16.5 V
VIN = 0 or 5 V
Room 0.001
1
1
Full
5
5
Room - 0.001 - 1
-1
Full
-5
-5
µA
Room 0.001
1
1
Full
5
5
Room - 0.001 - 1
-1
Full
-5
-5
SPECIFICATIONSa
Parameter
Analog Switch
Analog Signal Rangee
Drain-Source
On-Resistance
Dynamic Characteristics
Symbol
VANALOG
rDS(on)
Turn-On Time
tON
Turn-Off Time
Break-Before-Make
Time Delay
Transition Time
Charge Injection
Power Supplies
Positive Supply Current
tOFF
tD
tTRANS
Q
I+
Negative Supply Current
I-
Logic Supply Current
Ground Current
IL
IGND
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
VL = 5 V, VIN = 2.4 V, 0.8 Vf
A Suffix
D Suffix
- 55 to 125 °C - 40 to 85 °C
Tempb Typc Mind Maxd Mind Maxd Unit
IS = - 10 mA, VD = 3.8 V
V+ = 10.8 V,
Full
Room
Full
26
0
12
0
12 V
35
52
35
45
Ω
RL = 300 Ω, CL = 35 pF
VS = 8 V, See Switching
Time Test Circuit
Room
Full
100
Room
Full
38
RL = 300 Ω, CL = 35 pF
DG419B Room
62
RL = 300 Ω, CL = 35 pF
VS1 = 0 V, 8 V, VS2 = 8 V, 0 V
Room
Full
95
CL = 10 nF, Vgen = 0 V, Rgen = 0 Ω
Room
3
125
125
155
143
66
66
73
69
ns
25
25
119
119
153
141
pC
V+ = 13.2 V, VL = 5.25 V
VIN = 0 or 5 V
Room
Full
0.001
1
5
1
5
Room - 0.001
-1
-5
-1
-5
Room 0.001
1
5
1
µA
5
Room - 0.001
-1
-5
-1
-5
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. VIN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 72107
S-71009–Rev. C, 14-May-07