DG417BMIL Datasheet, PDF (4/11 Pages) Vishay Siliconix – Precision Monolithic Quad SPST CMOS Analog Switches

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DG417BMIL, DG418BMIL, DG419BMIL
Vishay Siliconix
SPECIFICATIONS^a
PARAMETER
Power Supplies
SYMBOL
TEST CONDITIONS
UNLESS OTHERWISE SPECIFIED
V+ = 12 V, V- = - 0 V
V_L = 5 V, V_IN = 2.4 V, 0.8 V^f
TEMP.^b
TYP.^c
A SUFFIX
- 55 °C to 125 °C
MIN.^d MAX.^d
UNIT
Positive Supply Current
I+
Room
0.001
1
Full
5
Negative Supply
Current
I-
Logic Supply Current
I_L
V+ = 16.5 V, V- = - 16.5 V
V_IN = 0 V or 5 V
Room - 0.001
-1
Full
-5
Room
0.001
Full
μA
1
5
Ground Current
I_GND
Room - 0.001
-1
Full
-5
Analog Switch
Analog Signal Range^e VANALOG
Full
0
12
V
Drain-Source
On-Resistance
R_DS(on)
I_S = - 10 mA, V_D = 3.8 V
V+ = 10.8 V
Room
26
Full
26
35

52
Dynamic Characteristics
Turn-On Time
Turn-Off Time
Break-Before-Make
Time Delay
Room
100
t_ON
R_L = 300 , C_L = 35 pF
Full
100
V_S = 8 V, see switching time test circuit
Room
38
t_OFF
Full
38
125
155
66
69
ns
t_D
R_L = 300 , C_L = 35 pF
DG419B
Room
62
25
Transition Time
t_TRANS
R_L = 300 , C_L = 35 pF
V_S1 = 0 V, 8 V, V_S2 = 8 V,0 V
Room
95
Full
95
119
153
Charge Injection
Q
C_L = 10 nF, V_gen = 0 V, R_gen = 0 
Room
18
pC
Power Supplies
Positive Supply Current
I+
Room
0.001
1
Full
0.001
5
Negative Supply
Current
I-
Logic Supply Current
I_L
V+ = 13.2 V, V_L = 5.25 V
V_IN = 0 V or 5 V
Room - 0.001
-1
-5
Room
0.001
μA
1
5
Ground Current
I_GND
Room - 0.001
-1
-5
Notes
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this datasheet.
e. Guaranteed by design, not subject to production test.
f. V_IN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
S12-0496-Rev. B, 05-Mar-12
4
Document Number: 63275
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