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DG411HS_11 Datasheet, PDF (4/17 Pages) Vishay Siliconix – Precision Monolithic Quad SPST CMOS Analog Switches
DG411HS, DG412HS, DG413HS
Vishay Siliconix
SPECIFICATIONSa
Parameter
Symbol
Dynamic Characteristics (Cont’d)
Off Isolatione
OIRR
Channel-to-Channel Crosstalke
Source Off Capacitancee
Drain Off Capacitancee
Channel On Capacitancee
XTALK
CS(off)
CD(off)
CD(on)
Power Supplies
Positive Supply Current
I+
Negative Supply Current
I-
Logic Supply Current
Ground Current
IL
IGND
Test Conditions
Unless Specified
V+ = 15 V, V- = - 15 V
VL = 5 V, VIN = 2.4 V, 0.8 Vf
Temp.b
Typ.c
A Suffix
D Suffix
- 55 °C to 125 °C - 40 °C to 85 °C
Min.d Max.d Min.d Max.d Unit
RL = 50 , CL = 5 pF
f = 1 MHz
Room - 91
Room - 88
dB
Room
12
f = 1 MHz
Room
12
pF
Room
30
Room 0.0001
1
1
Full
5
5
Room - 0.0001 - 1
-1
V+ = 16.5 V, V- = - 16.5 V
Full
-5
VIN = 0 or 5 V
Room 0.0001
1
-5
µA
1
Full
5
5
Room - 0.0001 - 1
-1
Full
-5
-5
SPECIFICATIONSa (for Unipolar Supplies)
Parameter
Analog Switch
Analog Signal Rangee
Drain-Source On-Resistance
Dynamic Characteristics
Symbol
Test Conditions
Unless Specified
V+ = 12 V, V- = 0 V
VL = 5 V, VIN = 2.4 V, 0.8 Vf
Temp.b
Typ.c
A Suffix
D Suffix
- 55 °C to 125 °C - 40 °C to 85 °C
Min.d Max.d Min.d Max.d Unit
VANALOG
Full
RDS(on)
V+ = 10.8 V, IS = - 10 mA
VD = 3 V, 8 V
Room
Full
49
12
12
V
80
100
80
100

Turn-On Time
Turn-Off Time
tON
Room
95
RL = 300 , CL = 35 pF
Hot
tOFF
VS = 8 V, see figure 2
Room
36
Hot
140
140
180
160
70
79
70
74
ns
Break-Before-Make
Time Delay
tD
DG413HS only, VS = 8 V
RL = 300 , CL = 35 pF
Room
60
Charge Injection
Q
Vg = 6 V, Rg = 0 , CL = 1 nF Room
60
pC
Power Supplies
Positive Supply Current
I+
Room 0.0001
1
1
Hot
5
5
Negative Supply Current
Logic Supply Current
I-
Room - 0.0001 - 1
-1
Hot
-5
-5
IL
V+ = 13.2 V, VIN = 0 or 5 V
Room 0.0001
Hot
1
5
µA
1
5
Ground Current
IGND
Room - 0.0001 - 1
-1
Hot
-5
-5
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. VIN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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4
Document Number: 72053
S11-0179-Rev. C, 07-Feb-11