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DG2788_11 Datasheet, PDF (4/10 Pages) Vishay Siliconix – Low Voltage, Low On-Resistance, Dual DPDT/Quad SPDT Analog Switch
DG2788, DG2789
Vishay Siliconix
SPECIFICATIONS (V+ = 4.3 V)
Parameter
Analog Switch
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 4.3 V, VIN = 0.5 or 1.6 Ve
Limits
- 40 °C to 85 °C
Temp.a Min.b Typ.c Max.b Unit
Analog Signal Ranged
VNO, VNC,
VCOM
Full
0
V+
V
On-Resistance
RON
V+ = 4.3 V, VCOM = 0.9 V, INO, INC = 100 mA
V+ = 4.3 V, VCOM = 2.5 V, INO, INC = 100 mA
Room
0.32
0.45
0.27
RON Flatnessd
RON Matchd
Switch Off Leakage
Currentd
RON
Flatness
RON
INO(off),
INC(offF)
ICOM(off)
V+ = 4.3 V, VCOM = 0 to V+,
INO, INC = 100 mA
V+ = 4.3 V, VNO, VNC = 0.3 V/4.0 V,
VCOM = 4.0 V/0.3 V
Full
Room
0.5

0.1
0.15
Room
0.03
Room
Full
Room
Full
-10
- 100
- 10
- 100
10
100
10
nA
100
Channel-On Leakage
Currentd
ICOM(on)
V+ = 4.3 V, VNO, VNC = VCOM = 3.0 V/4.0 V
Room
Full
- 10
- 100
10
100
Digital Control
Input High Voltage
Input Low Voltage
Input Capacitance
VINH
VINL
Cin
Full
1.6
Full
V
0.5
Full
6
pF
Input Current
IINL or IINH
Dynamic Characteristics
VIN = 0 or V+
Full
-1
1
µA
Charge Injectiond
QINJ
CL = 1 nF, VGEN = 0 V, RGEN = 0 
Room
105
pC
NO, NC Off Capacitanced
Channel-On Capacitanced
CNO(off)
CNC(off)
CNO(on)
CNC(on)
f = 1 MHz
Room
79
Room
79
pF
Room
183
Room
183
Power Supply
Power Supply Range
V+
4.3
V
Power Supply Current
I+
VIN = 0 or V+
Full
1.0
µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, not subjected to production test.
e. VIN = input voltage to perform proper function.
f. Crosstalk measured between channels.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 73863
S11-0303-Rev. E, 28-Feb-11