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DG3001 Datasheet, PDF (3/9 Pages) Vishay Siliconix – Low-Voltage Sub-Ohm SPST/SPDT MICRO FOOT® Analog Switch
DG3001/3002/3003
Vishay Siliconix
SPECIFICATIONS (V+ = 3.0 V)
Parameter
Analog Switch
Analog Signal Ranged
On-Resistanced
rON Flatnessd
rON Matchd
Switch Off Leakage Currentf
Channel-On Leakage Currentf
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 3 V, ± 10 %,VIN = 0.4 V or 2.0 Ve
Tempa
Limits
- 40 to 85 °C
Minb Typc Maxb
Unit
VNO, VNC,
VCOM
Full
0
V+
V
rON
V+ = 2.7 V, VCOM = 1.5 V
INO, INC = 10 mA
Room
Full
0.4
0.7
0.8
rON
Flatness
ΔrON
V+ = 2.7 V, VCOM = 0 to V+
INO, INC = 10 mA
Room
Room
0.1
0.2
Ω
0.01 0.05
INO(off)
INC(off)
ICOM(off)
V+ = 3.3 V,
VNO, VNC = 0.3 V/3 V, VCOM = 3 V/0.3 V
Room - 1
Full
- 10
Room - 1
Full
- 10
1
10
1
nA
10
ICOM(on)
V+ = 3.3 V, VNO, VNC = VCOM = 0.3 V/3 V
Room - 1
Full
- 10
1
10
Digital Control
Input High Voltage
Input Low Voltage
Input Capacitanced
Input Currentd
VINH
VINL
Cin
IINL or IINH
VIN = 0 or V+
Full
2
Full
V
0.4
Full
5
pF
Full
-1
1
µA
Dynamic Characteristics
Turn-On Timed
Turn-Off Timed
Break-Before-Make Timed
Charge Injectiond
Off-Isolationd
Crosstalkd
NO, NC Off Capacitanced
Channel-On Capacitanced
Power Supply
tON
Room
Full
tOFF
VNO or VNC = 2.0 V, RL = 300 Ω, CL = 35 pF
Figure 1 and 2
Room
Full
td
Room
1
QINJ
CL = 1 nF, VGEN = 0 V, RGEN = 0 Ω, Figure 3 Room
OIRR
XTALK
RL = 50 Ω, CL = 5 pF, f = 100 kHz
Room
Room
CNO(off)
CNC(off)
CON
VIN = 0 or V+, f = 1 MHz
Room
Room
47
71
40
59
ns
6
64
pC
- 70
dB
- 70
100
pF
340
Positive Supply Range
V+
2.7
3.3
V
Negative Supply Current
I+
VIN = 0 or V+
0.1
1.0 µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, nor subjected to production test.
e. VIN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 72505
S-70853–Rev. C, 30-Apr-07
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