DG2016_08 Datasheet, PDF (3/7 Pages) Vishay Siliconix – High-Bandwidth, Low Voltage, Dual SPDT Analog Switches

DG2016/DG2026
Vishay Siliconix
SPECIFICATIONS (V+ = 5 V)
Parameter
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 5 V, ± 10 %, V_IN = 0.8 or 2.4 V^e
Temp^a
Limits
- 40 to 85 °C
Min^b Typ^c Max^b
Unit
Analog Switch
Analog Signal Range^d
On-Resistance
r_ON Flatness
V_NO, V_NC
V_COM
Full
0
r_ON
V+ = 4.5 V, V_COM = 3 V, I_NO, I_NC = 10 mA
Room
Full
r_ON
Flatness
V+ = 4.5 V, V_COM = 0 to V+, I_NO, I_NC = 10 mA Room
V+
V
2.4
4.0
4.3
Ω
1.2
Switch Off
Leakage Current
I_NO(off)
I_NC(off)
I_COM(off)
V+ = 5.5 V
V_NO, V_NC = 1 V/4.5 V, V_COM = 4.5 V/1 V
Room - 1
Full - 10
Room - 1
Full - 10
1
10
1
10
nA
Channel-On
Leakage Current
I_COM(on)
V+ = 5.5 V, V_NO, V_NC = V_COM =1 V/4.5 V
Room - 1
Full - 10
1
10
Digital Control
Input High Voltage^d
Input Low Voltage
Input Capacitance
Input Current
Dynamic Characteristics
V_INH
V_INL
C_in
I_INL or I_INH
V_IN = 0 or V+
Full
2.0
Full
V
0.8
Full
5
pF
Full
1
1
µA
Turn-On Time
t_ON
Room
Full
23
48
52
Turn-Off Time
t_OFF
V_NO or V_NC = 3 V, R_L = 50 Ω, C_L = 35 pF
Room
Full
8
33
ns
35
Break-Before-Make Time
t_d
Full
1
Charge Injection^d
Q_INJ
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 Ω
Room
79
pC
Off-Isolation^d
Crosstalk^d
OIRR
Room
- 81
X_TALK
R_L = 50 Ω, C_L = 5 pF, f = 1 MHz
Room
- 82
dB
Source-Off Capacitance^d
Channel-On Capacitance^d
C_NO(off)
C_NC(off)
C_NO(on)
C_NC(on
Room
14
Room
14
V_IN = 0 or V+, f = 1 MHz
pF
Room
48
Room
44
Power Supply
Power Supply Range
V+
1.8
5.5
V
Power Supply Current
I+
V_IN = 0 or V+
Full
0.01
1.0
µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. Typical values are for design aid only, not guaranteed nor subject to production testing.
c. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
d. Guarantee by design, nor subjected to production test.
e. V_IN = input voltage to perform proper function.
f. Guaranteed by 5 V leakage testing, not production tested.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 72030
S-71009-Rev. C, 14-May-07
www.vishay.com
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