DG2612 Datasheet, PDF (2/7 Pages) Vishay Siliconix – Low-Voltage, Low rON, SPDT Audio Switch with Negative Swing Capability

DG2612/2613
Vishay Siliconix
SPECIFICATIONS (V+ = 3 V)
Parameter
Analog Switch
Analog Signal Range^d
On-Resistance
r_ON Match^d
r_ON Flatness^d
Shunt Switch Resistance
Switch Off Leakage Current
Channel-On Leakage Current
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 3 V, ± 10 %,V_IN = 0.5 V or 1.4 V^e
Limits
- 40 to 85 °C
Temp^a Min^b Typ^c Max^b Unit
V_NO, V_NC,
V_COM
r_ON
Δr_ON
r_ON
Flatness
V+ = 2.7 V, V_COM = - 1 V/0 V/1 V/2 V
I_NO, I_NC = 10 mA
Full
0
Room
Full
Room
Room
V+
V
1.0
1.4
1.6
0.1
Ω
0.3
R_SH
I_NO or I_NC = 10 mA, V+ = 2.7 V, DG2612 only Full
150 300 Ω
I_NO(off)
Room - 2
2
I_NC(off)
V+ = 3.3 V,
Full - 100
100
I_COM(off)
V_NO, V_NC= 1 V/3 V, V_COM = 3 V/1 V
Room - 2
Full - 100
2
100
nA
I_COM(on)
V+ = 3.3 V, V_NO, V_NC = V_COM = 1 V/3 V
Room - 2
Full - 100
2
100
Digital Control
V+ = 1.8 V to 2.0 V
1.0
Input High Voltage
V_INH
V+ = 2.7 V to 3.6 V
V+ = 4.2 V to 5.5 V
V+ = 1.8 V to 2.0 V
1.4
2.0
Full
V
0.4
Input Low Voltage
Input Capacitance
Input Current
Dynamic Characteristics
Turn-On Time
Turn-Off Time
V_INL
C_in
I_INL or I_INH
V+ = 2.7 V to 3.6 V
V+ = 4.2 V to 5.5 V
V_IN = 0 or V+
Full
Full
1
t_ON
Room
Full
t_OFF
V_NO or V_NC = 1.5 V, R_L = 50 Ω, C_L = 35 pF
Room
Full
0.5
0.8
5
pF
1
µA
34
60
63
10
35
ns
37
Break-Before-Make Time
Charge Injection^d (DG2613)
Off-Isolation^d
Crosstalk^d
Off-Isolation^d
Crosstalk^d
N_O, N_C Off Capacitance^d
Channel-On Capacitance^d
Power Supply
Power Supply Range
t_BBM
Q_INJ
OIRR
X_TALK
OIRR
X_TALK
C_NO(off)
C_NC(off)
C_ON
V+
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 Ω
R_L = 50 Ω, C_L = 5 pF, f = 100 kHz
DG2612
R_L = 50 Ω, C_L = 5 pF, f = 100 kHz
DG2613
V_IN = 0 or V+, f = 1 MHz
Room
4
16
Room
2.4
pC
Room
- 61
dB
Room
- 67
Room
- 67
dB
Room
- 73
Room
36
pF
Room
95
1.8
5.5
V
Power Supply Current
I+
V_IN = 0 or V+
0.01 1.0 µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. Typical values are for design aid only, not guaranteed nor subject to production testing.
c. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
d. Guarantee by design, nor subjected to production test.
e. V_IN = input voltage to perform proper function.
f. Guaranteed by 5 V leakage testing, not production tested.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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2
Document Number: 74339
S-61509-Rev. A, 28-Aug-06