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140CRH_11 Datasheet, PDF (12/13 Pages) Vishay Siliconix – Aluminum Capacitors SMD (Chip), High Temperature
140 CRH
Vishay BCcomponents
Aluminum Capacitors
SMD (Chip), High Temperature
Table 10
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
REQUIREMENTS
Mounting
Endurance
Useful life
IEC 60384-18,
subclause 4.3
IEC 60384-18/
CECC 32300,
subclause 4.15
CECC 30301,
subclause 1.8.1
Shall be performed prior to tests mentioned below;
reflow soldering;
for maximum temperature load refer to chapter “Mounting”
Tamb = 125 °C; UR applied;
for test duration see Table 8
Tamb = 125 °C; UR and IR applied;
for test duration see Table 8
C/C: ± 5 %
tan   spec. limit
IL2  spec. limit
UR = 6.3 V; C/C: ± 25 %
UR  10 V; C/C: ± 20 %
tan   2 x spec. limit
IL2  spec. limit
C/C: ± 30 %
tan   3 x spec. limit
IL2  spec. limit
no short or open circuit
total failure percentage: 1 %
Shelf life
(storage at high
temperature)
IEC 60384-18/
CECC 32300,
subclause 4.17
Tamb = 125 °C; no voltage applied;
1000 h
after test: UR to be applied for 30 min,
24 h to 48 h before measurement
For requirements
see “Endurance test” above
Reverse voltage
IEC 60384-18/
CECC 32300,
subclause 4.16
Tamb = 125 °C:
125 h at U = - 0.5 V,
followed by 125 h at UR
C/C: ± 15 %
tan   1.5 x spec. limit
IL2  spec. limit
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Document Number: 28396
Revision: 09-May-11
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000