DOC200103 Datasheet, PDF (6/20 Pages) Vectron International, Inc – Specification, Hybrid TCXO

adjustment shall be accomplished by connecting a resistor or trimmer potentiometer from it to
GND. The resistance range is 0Ω or GND to 20KΩ max. Nominal frequency typically occurs
in the range of 7.5KΩ to 12.5KΩ.
4.3.4
Frequency Aging. Aging limits, when tested in accordance with MIL-PRF-55310 Group B
inspection, shall not exceed ±1 ppm for the first year and ±5 ppm for 10 years for oscillators
that use crystals in the 10 MHz to 75 MHz range. For oscillators that use crystals greater than
75 MHz, the aging shall not exceed ±2 ppm for the first year and ±10 ppm for 10 years.
4.3.4.1 Frequency Aging Duration Option. By customer request, the Aging test may be terminated
after 15 days if the measured aging rate is less than half of the specified aging rate. This is a
common method of expediting 30-Day Aging without incurring risk to the hardware and used
quite successfully for numerous customers. It is based on the ‘least squares fit’ determinations
of MIL-PRF-55310 paragraph 4.8.35. The ‘half the time/half the spec’ limit is generally
conservative as roughly 2/3 of a unit’s Aging deviation occurs within that period of time.
Vectron’s automated aging systems acquire data every four hours, compared to the minimum
MIL-PRF-55310 requirement of once every 72 hours. This makes an extensive amount of data
available to perform very accurate aging projections. The delivered data would include the
Aging plots projected to 30 days. If the units would not perform within that limit then they
would continue to the full 30 Day term. Please advise by purchase order text if this may be an
acceptable option to exercise as it assists in Production Test planning.
4.3.5 Operating Characteristics. See Tables 2 and 3. Waveform measurement points and logic
limits are in accordance with MIL-PRF-55310. Start-up time is 10 msec typical and 30 msec
maximum.
4.3.6 Output Load. Standard Sinewave (50 ohms) and CMOS (10kΩ, 15pF) test loads are in
accordance with MIL-PRF-55310.
4.3.7 Phase Noise. Contact factory for typical performance. If custom and/or guaranteed
performance is required, Vectron can assign a custom part number.
5. QUALITY ASSURANCE PROVISIONS AND VERIFICATION
5.1 Verification and Test. Device lots shall be tested prior to delivery in accordance with the
applicable Screening Option letter as stated by the 16^th character of the part number. Table 5
tests are conducted in the order shown and annotated on the appropriate process travelers and
data sheets of the governing test procedure. For devices that require Screening Options that
include MIL-PRF-55310 Group A Testing, the Post-Burn-In Electrical Test and the Group A
Electrical Test are combined into one operation.
5.1.1
Screening Options. The Screening Options, by letter, are summarized as:
(S) MIL-PRF-55310 Class S Screening, Groups A & B QCI
(C) Modified MIL-PRF-55310 Class B Screening, Groups A & B QCI
(B) MIL-PRF-55310 Class B Screening, Groups A & B QCI
SIZE ^{CODE IDENT NO.}
A
00136
UNSPECIFIED TOLERANCES
N/A
DWG NO.
DOC200103
REV. SHEET
C
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