VS-709_12 Datasheet, PDF (3/9 Pages) Vectron International, Inc – Dual Frequency VCSO

VS-709 Dual Frequency VCSO
Absolute Maximum Ratings
Parameter
Symbol
Ratings
Unit
Power Supply
Input Current
Output Current
Voltage Control Range
Output Select
Storage Temperature
Soldering Temperature / Duration
V
CC
I
IN
I
OUT
V
C
OSelect
T
STR
T /t
PEAK P
0 to 6
100
25
0 to V
CC
0 to V_CC
-55 to 125
260 / 40
V
mA
mA
V
V
°C
°C / sec
Stresses in excess of the absolute maximum ratings can permanently damage the device. Also, exposure to these absolute
maximum ratings for extended periods may adversely affect device reliability. Functional operation is not implied at these or any
other conditions in excess of those represented in the operational sections of this datasheet. Permanent damage is also possible if
any device input (Vc or OS) draws >100 mA.
Test Circuits & Output Load Configuration
Functional Test: Allows use of standard power supply biasing con-
figuration. Pull down resistors are used for LV-PECL outputs and are
removed for LVDS outputs. Since the LVDS outputs are AC coupled,
the output DC levels cannots be measured.
Production Test: DC levels shown for VEE, OSelect, & Vc are for
devices configured for 3.3V operation. LV-PECL outputs are DC
coupled to 50Ω test equipment. LVDS outputs are connected to a
digital volt meter, then AC coupled to the test equipment. The digital
volt meter allows for Mid Level & Swing measurements.
LV-PECL to LV-PECL: For short transmission lengths,
the pull down resistor values shown provide reasonable power con-
sumption and waveform performance.
LVDS to LVDS: The 100Ω resistor should be removed if this load is
provided internally within the LVDS receiver.
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Vectron International • 267 Lowell Road, Hudson, NH 03051 • Tel: 1-88-VECTRON-1 • http://www.vectron.com
Rev: 06Aug2011