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TC9324F Datasheet, PDF (99/101 Pages) Toshiba Semiconductor – Single-Chip DTS Microcontroller (DTS-20)
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MUTE, DO, DO2 Output
Characteristics
Output
current
High level
Low level
Output off leakage current
TC9324F
Symbol
IOH1
IOL1
ITL
Test
Circuit
Test Condition
Min Typ. Max Unit
 VDD = 5 V, VOH = VDD − 0.5 V −1.25 −2.50 
mA
 VDD = 5 V, VOL = 0.5 V
1.25 2.50 

VDD = 5 V, VTLH = 5 V,
VTLL = 0 V (DO1, DO2)

 ±100 nA
HOLD , INTR/2, IN/2 Input Ports, RESET Input
Characteristics
Input leakage current
Symbol
ILI
Test
Circuit
Test Condition
 VIH = VDD, VIL = 0 V
Output
current
High level
Low level
VIH


VIL


Min Typ. Max Unit

 ±1.0 µA
VDD ×
0.8
~
VDD
V
0
~
VDD ×
0.2
AD Converter (ADIN~ADIN8, DCREF)
Characteristics
Analog input voltage range
Resolution
Linear error
Conversion total error
Analog input leakage
Reference voltage input current
Symbol
Test
Circuit
Test Condition
Min Typ. Max Unit
VAD
VRES
 ADin1~ADin8


0
~
VDD
V

8

bit




 VDD = 5 V, DCREF = 5 V
 ±0.5 ±1.0
LSB
 ±3.0 ±8.0
ILI

VDD = 5V, VIH = 5V, VIL = 0 V
(ADin1~ADin8)

 ±1.0 µA
IREF

VDD = 5V, DCREF = 5 V
(DCREF)

0.5 1.0 mA
Crystal Oscillators
Characteristics
XIN1 amp feedback resistance
XIN2 amp feedback resistance
XOUT1 output resistance
XOUT2 output resistance
Others
Characteristics
Input pulled-down resistance
Input amp feedback resistance
Symbol
RfXT1
RfXT2
ROUT1
ROUT2
Test
Circuit
Test Condition
 (XIN1−XOUT1)
 (XIN2−XOUT2)
 (XOUT1)
 (XOUT2)
Min Typ. Max Unit
0.35 1.0 3.00
MΩ
3.5
10 30.0
1.2 3.0 10.0
kΩ
1.5 4.0 15.0
Symbol
RIN2
RfIN
Test
Circuit
Test Condition
 (TEST)

VPLL = 3.5 V
(FMin, AMin, IFin1, IFin2)
Min Typ. Max Unit
15.0 60 250
kΩ
350 800 3500
99
2002-02-08
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