TLP3122 Datasheet, PDF (5/6 Pages) Toshiba Semiconductor – Logic Testers / Memory Testers

tON,tOFF ─ I _F
Ta = 25 ℃
VDD = 20 V, RL = 200 Ω
10
1
t _OFF
t _ON
0.11
10
Input current I _F (mA)
10
5 ^{VOFF =60 V}
3
I _OFF ─ Ta
1
0.5
0.3
0.1
0.05
0.03
0.01
-20
0
20
40
60
80
100
Ambient temperature Ta (°C)
TLP3122
tON,tOFF ─ Ta
VDD = 20 V
RL = 200 Ω I _F = 5 mA
10
t _ON
1
t _OFF
0.1-20
0
20
40
60
80
100
Ambient temperature Ta (°C)
5
2007-10-01