TLP3122 Datasheet, PDF (4/6 Pages) Toshiba Semiconductor – Logic Testers / Memory Testers

I _F ─ Ta
100
80
60
40
20
0-20
0
20 40 60 80 100 120
Ambient temperature Ta (°C)
100
50 ^{Ta = 25 °C}
30
I _F ─ VF
10
5
3
1
0.5
0.3
0.1
0.6
0.8
1
1.2
1.4
1.6
1.8
Forward voltage VF (V)
0.8
I _ON = 1A
0.7 _{I F = 5 mA}
0.6
RON ─ Ta
0.5
0.4
0.3
0.2
0.1
0-20
0
20
40
60
80
100
Ambient temperature Ta (°C)
TLP3122
I _ON ─ Ta
1.2
1
0.8
0.6
0.4
0.2
0-20
0
20 40 60 80 100 120
Ambient temperature Ta (°C)
1.2
Ta = 25 °C
1.0
0.8 ^{I F = 5 mA}
I _ON ─ VON
0.6
0.4
0.2
0
-0.2
-0.4
-0.6
-0.8
-1.0
-1.2
-300 -250 -200 -150-100 -50 0 50 100 150 200 250 300
On-stage voltage VON (mV)
1.4
I _ON =0.1A
1.2
I _FT ─ Ta
1.0
0.8
0.6
0.4
0.2
0.0-20
0
20
40
60
80
100
Ambient temperature Ta (°C)
4
2007-10-01