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TLP2601_07 Datasheet, PDF (5/9 Pages) Toshiba Semiconductor – Simplex / Multiplex Data Transmission
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Test Circuit 1.
tpHL and tpLH
Input IF
tpHL
Output VO
TLP2601
IF = 7.5mA
IF = 3.75mA
Pulse
1
generator
ZO = 50Ω
2
tr = 5ns
tpLH
VOH
1.5V
VOL
3
IF
Monitoring
4
node
VCC 8
7
6
5
GND
5V
RL
VO
(*) Output
CL monitor-
ing
node
(*) CL is approximately 15pF which includes probe and stray wiring capacitance.
Test Circuit 2.
tELH and tEHL
Input VE
Output VO
tEHL
3.0V
1.5V
tELH
VOH
1.5V
VOL
Pulse
generator
ZO = 50 Ω
tr = 5ns
7.5mA
dc
IF
Input VE
monitoring node
1
VCC 8
2
7
3
6
4
5
GND
5V
RL
VO
(*) Output
CL monitor-
ing
node
(*) CL is approximately 15pF which includes probe and stray wiring capacitance.
Test Circuit 3.
Transient Immunity and Typ. Waveforms.
10%
VCM
90% 10%
tr
VO
Switch at A : IF = 0mA
VO
Switch at B : IF = 5mA
90%
tf
400V
0V
5V
VOL
1
IF
2
A
3
B
4
VFF
Pulse gen.
ZO = 50 Ω
VCC 8
7
6
5
GND
VCM
5V
RL
VO
5
2007-10-01
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