TLP2116 Datasheet, PDF (5/6 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs Ired & PHOTO-IC

Test Circuit 1: Switching Time Test Circuit
I_F=12 mA (P.G)
(f=5 MHz , duty=50%,
less than t_r = t_f= 5 ns)
1
IF monitor
2
3
8
V_CC
7
VO monitor
0.1 μF
6
C_L = 15 pF
4
GND 5
SHIELD
R_IN = 100 Ω
C_L = 15 pF
I_F
tf
V_O
VCC
1.5 V
tpHL
C_L is capacitance of the probe and JIG.
(P.G) : Pulse Generator
Test Circuit 2: Switching Time Test Circuit
VIN=5V (P.G)
(f=5 MHz , duty=50%,
less than t_r = t_f= 5 ns)
VIN monitor
1
C_L = 15 pF
2
3
8
VCC
7
VO monitor
0.1 μF
6
C_IN = 27 pF
4
GND 5
SHIELD
R_IN=430 Ω
C_L=15pF
I_F
tf
V_O
VCC
1.5 V
tpHL
TLP2116
50%
tr
V_OH
90%
10%
tpLH
V_OL
50%
tr
V_OH
90%
10%
tpLH
V_OL
C_L is capacitance of the probe and JIG.
(P.G) : Pulse Generator
Test Circuit 3: Common-Mode Transient Immunity Test Circuit
1000Ｖ
90%
90%
SW →^{IF 1}
AB
2
3
4
8
VCC
7
6
0.1μF
Vo
GND ⁵
SHIELD
VCM
10%
・SW B: IF=0mA
V_CC
VO
・SW A: IF=12mA
tr
4V
tf
10%
CMH
0.4V
CML
＋
－
VCï¼­
800(V)
CMH＝ _tr(μs)
800(V)
CML＝- _tf(μs)
5
2008-06-11