TLP2105 Datasheet, PDF (5/11 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs Ired & PHOTO-IC

TLP2105
TEST CIRCUIT 7: Switching Time Test Circuit
IF=3 mA(P.G.)
(f=50 kHz, duty =50%)
1
IF _monitor
2
VCC
VCC
VO
8
0.1 μF
7
5V
620 Ω ^IF
CL=15 pF
3
6
4
GND ⁵
SHIELD
RIN=100 Ω
5 kΩ
CL
VOH
VO
VOL
CL includes probe and stray capacitance.
P.G.: Pulse generator
TEST CIRCUIT 8: Switching Time Test Circuit
IF= 3 mA(P.G.)
(f=50 kHz, duty=50%)
1
IF _monitor
2
3
8
VCC
7
0.1 μF
6
CL=15 pF
4
GND ⁵
SHIELD
RIN=100 Ω
VO
VCC
CL
CL includes probe and stray capacitance.
P.G.: Pulse generator
IF
VOH
VO
VOL
tpLH
1.3 V
tr
tpLH
1.3V
tr
tpHL
50%
90%
10%
tf
tpHL
50%
90%
10%
tf
TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit
SW _→^IF
A
B
1
8
VCC
2
7
3
6
4
GND ⁵
SHIELD
+
－
VCM
0.1 μF
VO
VCM
VCC
・SW A : IF=5 mA
VO
・SW B : IF=0 mA
tr
1V
90% ^{1000 V}
10%
tf
CMH
17 V
CML
CM _H
=
800(V )
t _f ^(μs)
CM _L
=
800(V )
t _r ^(μs)
5
2008-11-26