TLP2066 Datasheet, PDF (5/6 Pages) Toshiba Semiconductor – High Speed Interface 3.3V Supply Voltage

TLP2066
TEST CIRCUIT 5: tpHL , tpLH
I_F=12mA (P.G)
(f=5MHz, duty=50%
tr =tf =5ns)
VCC
INPUT
MONITORING
NODE
CL=15pF
SHIELD
R_IN=100Ω
GND
Vo
0.1uF ^MONITORING
NODE
V_CC
CL=15pF
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
TEST CIRCUIT 6: tpHL, tpLH
IF
V_O
tf
1.5V
tpHL
V_IN=3.3V (P.G) _{INPUT MONITORING NODE}
(f=5MHz, duty=50%
tr = tf =5ns)
VCC
CL=15pF
C_IN=47pF
SHIELD
R_IN=220Ω
GND
Vo
0.1uF MONITORING
NODE
V_CC
CL=15pF
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
VIN
V_O
tf
1.5V
tpHL
50%
tr
VOH
90%
10% _VOL
tpLH
50%
tr
VOH
90%
10% _VOL
tpLH
TEST CIRCUIT 7: Common-Mode Transient Immunity Test Circuit
SW
IF
→
A
B
1
6
VCC
5 ^0.1uF
V_O
V_CC
3
GND ⁴
SHIELD
V_CM
90%
10%
tr
・SW B: IF=0mA
2V
・SW A: IF=12mA
1000V
tf
CM_H
0.8V
CM_L
CMH
=
800(V)
tr(μs)
CML
=
800(V)
tf ^(μs)
5
2007-11-20