TLP116A Datasheet, PDF (5/9 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs LED & PHOTO-IC

TEST CIRCUIT 5: tpHL, tpLH
I_F = 12 mA(P.G)
(f = 5 MHz , duty = 50%
less than tr = tf = 5 ns)
VCC
INPUT
MONITORING
NODE
CL=15 pF
SHIELD
R_IN=100 Ω
GND
0.1 μF
IF
Vo
tf
MONITORING
NODE
V_O
V_CC
CL = 15 pF
1.5 V
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
tpHL
TEST CIRCUIT 6: tpHL, tpLH
V_IN = 5 V(P.G)
INPUT MONITORING NODE
(f = 5 MHz , duty = 50%
less than tr = tf = 5 ns)
VCC
CL=15 pF
C_IN=27 pF
SHIELD
R_IN=470 Ω
GND
0.1 μF
Vo
MONITORING
IF
NODE
V_CC
tf
CL=15 pF
V_O
1.5 V
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
tpHL
TLP116A
50%
tr
90%^VOH
10%
tpLH
VOL
50%
tr
90%^VOH
10%
tpLH
VOL
TEST CIRCUIT 7: Common-Mode Transient Immunity Test Circuit
SW
I_F
→
A
B
1
6
VCC
5 ^0.1
V_O
V_CC
3
GND ⁴
SHIELD
V_CM
90%
10%
tr
・SW B : IF=0 mA
4V
・SW A : IF=5 mA
1000 V
tf
CM_H
0.4 V
CM_L
CM _H
=
800(V )
t _r ^(μs)
CM
L
=
800(V )
t _f ^(μs)
5
2008-10-01