TLP116A Datasheet, PDF (4/9 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs LED & PHOTO-IC

Switching Characteristics
(Unless otherwise specified, Ta=-40 to 100°C, VCC=4.5 to 5.5 V)
Characteristic
Symbol
Test
Circuit
Conditions
Min. Typ.
Propagation delay time
to logic high output
Propagation delay time
to logic low output
tpHL
tpLH
IF = 0→12 mA R_IN = 100 Ω
—
—
5
CL = 15 pF
IF = 12→0 mA ^{(Note 5)}
—
—
Propagation delay time
to logic high output
Propagation delay time
to logic low output
tpHL
tpLH
V_IN = 0→5 V
R_IN = 470 Ω
—
—
6
(IF = 0→8 mA)
V_IN = 5→0 V
C_{IN =} 27 pF
CL = 15 pF
(IF = 8→0 mA) ^{(Note 5)}
—
—
Switching time dispersion
between ON and OFF
|tpHL-
tpLH|
IF = 12 mA , R_IN = 100 Ω,
CL =v15 pF (Note 5)
—
—
Output fall time(90-10%)
tf
Output rise time(10-90%)
tr
5
IF = 0→12 mA ^RIN ^{= 100 Ω}
—
15
CL = 15 pF
IF = 12→0 mA (Note 5)
—
15
Common mode transient
immunity at high Level
output
Common mode transient
immunity at low level
output
CMH
CML
VCM = 1000 Vp-p, IF = 0 mA,
Vo(Min) = 4 V, Ta = 25°C
10000 —
7
VCM = 1000 Vp-p, IF = 12 mA,
-10000
—
Vo(Max) = 0.4 V, Ta = 25°C
*All typical values are at Ta=25°C
Note 5: CL is approximately 15 pF which includes probe and Jig/stray wiring capacitance.
TLP116A
Max. Unit
60
ns
60
ns
60
ns
60
ns
30
ns
—
ns
—
ns
—
V/μs
—
V/μs
TEST CIRCUIT 1: VOL
I_{F 1}
→
↑
3
6
VCC
0.1 μF
5
V_CC
GND ⁴
V_OL IOL
V↑
SHIELD
TEST CIRCUIT 2: VOH
1
6
VCC
5
V ^VOH ↑ ^IOH
V_CC
0.1 μF
3
GND ⁴
SHIELD
TEST CIRCUIT 3: ICCL
I_F
→
1
↑
3
6
I_CCL
VCC
A
5 ^{0.1 μF}
V_CC
GND ⁴
SHIELD
TEST CIRCUIT 4: ICCH
1
6
I_CCH
VCC
A
5 ^{0.1 μF}
V_CC
3
GND ⁴
SHIELD
4
2008-10-01