TLP105 Datasheet, PDF (5/6 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs IRED & PHOTO-IC

Test Circuit 7: Switching Time Test Circuit
IF=3 mA (P.G)
(f=50 kHz , duty=50%,
tr=tf=5 ns)
I_F
1
V_CC
V_CC V_O
6
0.1μF
5
3
GND ⁴
SHIELD
C_L
5V
I_F
5 kΩ
620 Ω
V_OH
V_O
V_OL
C_L is approximately 15 pF which includes
probe and stray capacitance.
P.G.: Pulse generator
t_pLH
1.3V
t_r
TLP105
50%
t_pHL
90%
10%
t_f
Test Circuit 8: Switching Time Test Circuit
IF=3 mA (P.G)
(f=50 kHz , duty=50%,
tr=tf=5 ns)
I_F
1
6
V_CC
5
0.1μF
3
4
GND
SHIELD
V_O
C_L
I_F
V_{CC VOH}
V_O
V_OL
C_L is approximately 15 pF which includes
probe and stray capacitance.
P.G.: Pulse generator
t_pLH
1.3V
t_r
50%
t_pHL
90%
10%
t_f
Test Circuit 9: Common Mode Transient Immunity Test Circuit
SW
A
I_F
→
B
1
6
90%
V_CC
5 ^0.1μF
V_O
V_CM
10%
t_r
3
GND ⁴
SHIELD
V_CC
・SW A : IF=5 mA
V_CM
V_O
１V
・SW B : I_F=0 mA
1000Ｖ
t_f
CM_H
17V
CM_L
CM _H
=
800(V )
t _f ^(μs)
CM _L
=
800(V )
t _r ^(μs)
5
2008-08-27