TLP105 Datasheet, PDF (4/6 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs IRED & PHOTO-IC

TLP105
Switching Characteristics
(Unless otherwise specified, Ta = -40 to 100°C,VCC = 4.5 to 20 V)
CHARACTERISTIC
TEST
SYMBOL _CIRCUIT
CONDITION
Propagation Delay Time
to Logic High output
tpLH
IF=0→3 mA
Propagation Delay Time
to Logic Low output
Switching Time Dispersion
between ON and OFF
tpHL
|tpHL-
tpLH|
IF=3→0 mA
7, 8
―
Rise Time (10 – 90 %)
Fall Time (90 – 10 %)
Common Mode transient
Immunity at High Level Output
Common Mode transient
Immunity at Low Level Output
tr
tf
CMH
CML
IF=0→3 mA , VCC=5 V
IF=3→0 mA , VCC=5 V
VCM=1000V_p-p,IF=5 mA,
9
VCC=20 V,Ta=25°C
VCM=1000Vp-p,IF=0 mA,
VCC=20 V,Ta=25°C
*All typical values are at Ta=25°C
MIN. TYP.
30
150
30
150
―
―
―
30
―
30
-10000 ―
10000
―
MAX.
250
250
220
75
75
―
―
UNIT
ns
ns
ns
ns
ns
V/μs
V/μs
Test Circuit 1: VOL
1
6
V_CC
5
0 .1μF
3
GND ⁴
V_OL I_OL
V↑
V_CC
SHIELD
Test Circuit 2: VOH
I_{F→ 1}
6
V_CC
5
↑
3
GND ⁴
SHIELD
V_OH I_OH
V↑
0.1μF
V_CC
Test Circuit 3: ICCL
1
6 ^ICCL
V_CC
A
5
V _CC
0.1 μF
3
GND ⁴
SHIELD
Test Circuit 4: ICCH
I_→F 1
6
V _CC
I_CCH
A
↑
3
5
V_CC
GND ⁴
SHIELD
0.1μF
Test Circuit 5: IOSL
1
6
V_CC
5
0.1 μF
A
3
GND ⁴
I_OSL
V_CC
SHIELD
V_O
Test Circuit 6: IOSH
I_F 1
→
6
V_CC
5
↑
3
GND ⁴
SHIELD
0 .1μF
A
I_OSH
V_O
V_CC
4
2008-08-27