TLP102_05 Datasheet, PDF (5/6 Pages) Toshiba Semiconductor – PHOTO-IC Intelligent Power Module Signal Isolation

TLP102
TEST CIRCUIT 7: Switching Time Test Circuit
IF
VCC
IF
0.1uF
V_O
V_CC
tpHL
GND
SHIELD
C_L
VOH
V_O
1.3V
VOL
tf
TEST CIRCUIT 8: Switching Time Test Circuit
VCC VO
5V
IF
IF
VCC
0.1uF
620Ω
GND
SHIELD
CL 5kΩ
VOH
V_O
1.3V
VOL
CL: stray capacitance of probe and wiring (to 15 pF)
tpHL
tf
50%
tpLH
90%
10%
tr
50%
tpLH
90%
10%
tr
TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit
SW ^IF
→
A
B
１
6
90%
VCC
5 ^0.1uF
VO
VCM
10%
tr
3
GND ⁴
SHIELD
V_CC
・SW B : IF=0mA
17V
VC_ï¼­
V_O
・SW A : IF=5mA
1000Ｖ
tf
CM_H
１V
CM_L
CM _H
= ^{800(V )}
t _r ^(μs)
CM
L
=
800(V )
t _f ^(μs)
5
2005-04-22