TLP102_05 Datasheet, PDF (4/6 Pages) Toshiba Semiconductor – PHOTO-IC Intelligent Power Module Signal Isolation

TLP102
Switching Characteristics
(Unless otherwise specified, Ta = -40~85°C,VCC = 4.5~20 V.)
CHARACTERISTIC
TEST
SYMBOL _CIRCUIT
CONDITION
MIN.
Propagation Delay Time
to Logic HIGH Output
tpLH
IF = 5→0 mA, CL = 100 pF
50
VCC = 20 V
Propagation Delay Time
IF = 0→5 mA, CL = 100 pF
tpHL
50
to Logic LOW Output
VCC = 20 V
7
Switching Time Dispersion
|tpHL-
CL = 100 pF
―
between ON and OFF
tpLH|
Output Rise Time
tr
IF = 5→0 mA, VCC = 20 V
―
Output Fall Time
tf
IF = 0→5 mA, VCC = 20 V
―
Propagation Delay Time
tpLH
IF = 5→0 mA
50
to Logic HIGH Output
8
Propagation Delay Time
tpHL
IF = 0→5 mA
50
to Logic LOW Output
Common-Mode Transient
Immunity at HIGH Level
Output
Common-Mode Transient
Immunity at LOW Level
Output
CMH
CML
VCM = 1000 Vp-p, IF = 0 mA,
10000
VCC = 20 V, Ta = 25°C
9
VCM = 1000 Vp-p, IF = 5 mA,
-10000
VCC = 20 V, Ta = 25°C
*All typical values are at Ta = 25°C.
TYP.
250
270
―
175
95
―
―
―
―
MAX.
400
400
350
―
―
400
400
―
―
UNIT
ns
ns
ns
ns
ns
ns
ns
V/us
V/us
TEST CIRCUIT 1 : VOL
IF
→
1
↑
3
VCC
6
5
0.1uF
V_CC
GND ⁴
V_OL IOL
V↑
SHIELD
TEST CIRCUIT 2 : VOH
1
6
VCC
V ^{VOH ↑ IOH}
5
V_CC
0.1uF
3
GND ⁴
SHIELD
TEST CIRCUIT 3 : ICCL
IF
→
1
6 ^ICCL
VCC
A
↑
5
V_CC
3
GND ⁴
SHIELD
TEST CIRCUIT 5 : IOSL
IF
→
1
↑
3
6
VCC
0.1uF
5
A
IOSL
V_CC
GND ⁴
SHIELD
VO
TEST CIRCUIT 4 : ICCH
1
6
ICCH
VCC
A
5
V_CC
3
GND ⁴
SHIELD
TEST CIRCUIT 6 : IOSH
1
6
VCC
0.1uF
5
A
V_O
3
IOSH
VCC
GND ⁴
SHIELD
4
2005-04-22