TLP3111_14 Datasheet, PDF (4/6 Pages) Toshiba Semiconductor – Measurement Instruments Logic IC Testers / Memory Testers Board Testers / Scanners

I _F ─ Ta
60
50
40
30
20
10
0-20
0
20 40 60 80 100
Ambient temperature Ta (°C)
I _F ─ VF
100
T_a = 25℃
10
1
0.10.6
0.9
1.2
1.5
1.8
Forward voltage VF (V)
R _ON ─ Ta
20 _{ION = 100 mA}
18 ^IF ^{= 5 mA}
t<1 s
16
14
12
10
8
6-40 _{-20 0 20 40 60 80 100}
Ambient temperature Ta (°C)
TLP3111
I _ON ─ Ta
150
100
50
0-20
0
20
40
60
80 100
Ambient temperature Ta (°C)
I _ON ─ VON
150
T_a = 25℃
100 _{IF = 10 mA}
50
0
-50
-100
-150-1.5
-1
-0.5
0
0.5
1
1.5
On-sate voltage VON (V)
I _FT ─ Ta
1.2
I_ON = 100 mA
t<1 s
1.0
0.8
0.6
0.4
0.2
0-40 _-20
0
20 40 60 80 100
Ambient temperature Ta (°C)
4
2014-09-01