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TLP3111_14 Datasheet, PDF (2/6 Pages) Toshiba Semiconductor – Measurement Instruments Logic IC Testers / Memory Testers Board Testers / Scanners | |||
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TLP3111
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Forward current
Forward current derating (Ta ⥠25°C)
Reverse voltage
Junction temperature
Offâstate output voltage
Onâstate current
On-State Current Derating (Ta ⥠25°C)
Junction temperature
Storage temperature
Operating temperature
Soldering temperature (10 s)
Isolation voltage (AC, 1 minute, R.H. ⤠60%) (Note 1)
IF
ÎIF/°C
VR
Tj
VOFF
ION
ÎION/°C
Tj
Tstg
Topr
Tsol
BVS
50
â0.5
6
125
80
100
â1.0
125
â40 to 125
â20 to 85
260
1500
mA
mA/°C
V
°C
V
mA
mA/°C
°C
°C
°C
°C
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(âHandling Precautionsâ/âDerating Concept and Methodsâ) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc.).
(Note 1): Device considered a twoâterminal device: Pins 1 and 2 shorted together, and pins 3 and 4 shorted together.
Recommended Operating Conditions
Characteristic
Symbol
Min Typ. Max Unit
Supply voltage
Forward current
Onâstate current
Operating temperature
VOFF
IF
ION
Topr
â
â
64
V
10
â
30
mA
â
â
100 mA
-20
â
65
°C
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
Individual Electrical Characteristics (Ta = 25°C)
Characteristic
Forward voltage
Reverse voltage
Capacitance
Offâstate current
Symbol
VF
IR
CT
IOFF
Test Condition
IF = 20 mA
VR = 6 V
V = 0, f = 1 MHz
VOFF = 30 V, Ta = 50°C
Capacitance
COFF
V = 0, f = 1 MHz
Min Typ. Max Unit
1.0
1.2
1.4
V
â
â
10
μA
â
15
â
pF
â 0.05
1
nA
â
11
15
pF
2
2014-09-01
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