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TLP2631_07 Datasheet, PDF (4/8 Pages) Toshiba Semiconductor – Isolated Line Receiver
TLP2631
Switching Characteristics (Ta = 25°C, VCC = 5V)
Characteristic
Propagation delay time to
low output level
Propagation delay time to
high output level
Output rise time, output
fall time (10~90%)
Common mode transient
immunity at high output
level
Common mode transient
immunity at low output
level
Symbol
tpHL
tpLH
tr, tf
CMH
CML
Test
Circuit
1
1
1
2
2
Test Condition
IF = 0→7.5mA, RL = 350Ω
CL = 15pF (each channel)
IF = 7.5mA→0, RL = 350Ω
CL = 15pF (each channel)
IF = 0 7.5mA, RL = 350Ω
CL = 15pF (each channel)
IF = 0, RL = 350Ω
VCM = 400V,
VO(min.) = 2V
(each channel, Note 4)
IF = 7.5mA, RL = 350Ω
VCM = 400V
VO(max.) = 0.8V
(each channel, Note 5)
Min.
Typ.
―
60
―
60
―
30
1000 10000
−1000 −10000
Max.
75
75
―
―
―
Unit
ns
ns
ns
V / μs
V / μs
(Note 1) 2mm below seating plane
(Note 2) The VCC supply voltage to each TLP2631 isolator must be bypassed by a 0.01μF capacitor or larger. This
can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should
be connected as close as possible to the package VCC and GND pins each device.
(Note 3) Device considered a two−terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8
shorted together.
(Note 4) CMHï½¥the maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in
the high state (i.e., VOUT > 2.0V).
Measured in volts per microsecond (V / μs).
Volts/ microsecond can be translated to sinusoidial voltages:
V
/
μs
=
(dVCM) Max.
dt
=
fCM
VCM(p.p.)
Example:
VCM = 319Vpp when fCM = 1MHz using CML and CMH = 1000V / μs data sheet specified minimum.
(Note 5) CMLï½¥the maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in
the low output state (i.e., VOUT > 0.8V).
Measured in volts per microsecond (V / μs).
(Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together.
4
2007-10-01