TLP2095 Datasheet, PDF (4/11 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs IRED & PHOTO-IC

TLP2095
Switching Characteristics
(Unless otherwise specified, Ta = -40 to 100°C,VCC = 3.0 to 20 V)
CHARACTERISTIC
TEST
SYMBOL _CIRCUIT
CONDITION
MIN TYP.
Propagation Delay Time
to Logic High output
tpLH
IF = 0→5 mA
30
150
Propagation Delay Time
to Logic Low output
tpHL
IF = 5→0 mA
7, 8
30
150
Switching Time Dispersion
|tpHL- (Note5)
―
between ON and OFF
tpLH|
―
―
Rise Time (10 – 90 %)
tr
IF=0→5 mA , VCC=5 V
―
30
Fall Time (90 – 10 %)
tf
IF=5→0 mA , VCC=5 V
―
30
Common Mode transient
Immunity at High Level Output
Common Mode transient
Immunity at Low Level Output
CMH
CML
VCM=1000V_p-p,IF=5 mA,
-15
―
9
VCC=20 V,Ta=25°C
VCM=1000Vp-p,IF=0 mA,
15
―
VCC=20 V,Ta=25°C
*All typical values are at Ta=25°C
Note5. V_CC=4.5 to 20V at test circuit 7.
MAX UNIT
250
ns
250
ns
220
ns
75
ns
75
ns
―
kV/μs
―
kV/μs
TEST CIRCUIT 1: VOL
1
6
V_CC
5
0.1μF
V_CC
3
GND ⁴
V_OL I_OL
V↑
SHIELD
TEST CIRCUIT 2: VOH
I_F
→
1
6
V_CC
5
↑
3
GND ⁴
SHIELD
V_O
V
0.1μF
↑ ^IOH
V_CC
*V_OH= V_CC-V_O
TEST CIRCUIT 3: ICCL
1
6 ^ICCL
V_CC
A
5
V_CC
0.1μF
3
GND ⁴
SHIELD
TEST CIRCUIT 4: ICCH
I_F
→
1
I_CCH
6
V_CC
A
↑
3
5
V_CC
GND ⁴
SHIELD
0.1μF
TEST CIRCUIT 5: IOSL
TEST CIRCUIT 6: IOSH
1
6
V_CC
5 ^0.1μF
A
3
GND ^{4 IOSL}
V_CC
SHIELD
V_O
I_{F 1}
→
↑
3
6
V_CC
5
GND ⁴
SHIELD
0.1μF
A
I_OSH
V_O
V_CC
4
2009-08-11