TCD2950D Datasheet, PDF (4/13 Pages) Toshiba Semiconductor – Image SensorCCD (charge coupled device)

TCD2950D
Note 8: V_DRK is defined as average dark signal voltage of all effective pixels.
DSNU is defined as different voltage between V_DRK and V_MDK when V_MDK is maximum dark signal
voltage.
V_MDK
V_DRK
DSNU
Note 9: DC signal output voltage is defined as follows. Reset noise voltage is defined as follows.
Masking noise voltage is defined as follows.
OS
V_RSN
V_OS
V_MS
SS
Note 10: Random noise is defined as the standard deviation (sigma) of the output level difference between two
adjacent effective pixels under no illumination (i.e. darkconditions) calculated by the following procedure.
Output waveform
(effective pixels under
dark condition)
video output
200 ns
video output
200 ns
DV
pixel (n)
pixel (n + 1)
(1) Two adjacent pixels (pixel n and n + 1) in one reading are fixed as measurement points.
(2) Each of the output level at video output periods averaged over 200 ns period to get V (n) and V (n + 1).
(3) V (n + 1) is subtracted from V (n) to get DV.
DV = V (n) - V (n + 1)
(4) The standard deviation of DV is calculated after procedure (2) and (3) are repeated 30 times (30
readings).
DV
=
1
30
30
Ã¥|
i=1
∆Vi
|
I=
1
30
30
Ã¥ (|
i=1
DV_i
|－DV )²
(5) Procedure (2), (3) and (4) are repeated 10 times to get sigma value.
(6) 10 sigma values are averaged.
I
=
1
10
10
Ã¥I
j=1
j
(7) I value calculated using the above procedure is observed 2 times larger than that measured
relative to the ground level. So we specify random noise as follows.
NDI = ¹ I
2
4
2002-01-31