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TC74AC245P_07 Datasheet, PDF (4/9 Pages) Toshiba Semiconductor – CMOS Digital Integrated Circuit Silicon Monolithic
TC74AC245,640P/F/FT
Electrical Characteristics
DC Characteristics
Characteristics
Symbol
High-level input
voltage
VIH
Test Condition
―
Ta =
Ta = 25°C
−40 to 85°C
Unit
VCC
(V)
Min
Typ.
Max
Min
Max
2.0 1.50 ―
― 1.50 ―
3.0 2.10 ―
― 2.10 ―
V
5.5 3.85 ―
― 3.85 ―
Low-level input
voltage
VIL
2.0 ―
― 0.50 ― 0.50
―
3.0 ―
― 0.90
― 0.90
V
5.5 ―
― 1.65 ― 1.65
2.0 1.9 2.0
―
1.9
―
High-level output
voltage
VOH
IOH = −50 μA
VIN
= VIH or
VIL
IOH = −4 mA
IOH = −24 mA
3.0 2.9 3.0
―
2.9
―
4.5 4.4 4.5
―
4.4
―
V
3.0 2.58 ―
― 2.48 ―
4.5 3.94 ―
― 3.80 ―
IOH = −75 mA (Note) 5.5 ―
―
― 3.85 ―
2.0 ―
0.0 0.1
―
0.1
Low-level output
voltage
3-state output
off-state current
Input leakage
current
IOL = 50 μA
VIN
VOL
= VIH or
VIL
IOL = 12 mA
3.0 ―
0.0 0.1
―
0.1
4.5 ―
0.0 0.1
―
0.1
V
3.0 ―
― 0.36 ― 0.44
IOL = 24 mA
4.5 ―
― 0.36 ― 0.44
IOL = 75 mA (Note) 5.5 ―
―
―
― 1.65
VIN = VIH or VIL
IOZ
VOUT = VCC or GND
5.5 ―
― ±0.5 ― ±5.0 μA
IIN
VIN = VCC or GND
5.5 ―
― ±0.1 ― ±1.0 μA
Quiescent supply
current
ICC
VIN = VCC or GND
5.5 ―
―
8.0
― 80.0 μA
Note:
This spec indicates the capability of driving 50 Ω transmission lines.
One output should be tested at a time for a 10 ms maximum duration.
4
2007-10-01