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TC74AC245P_07 Datasheet, PDF (4/9 Pages) Toshiba Semiconductor – CMOS Digital Integrated Circuit Silicon Monolithic | |||
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TC74AC245,640P/F/FT
Electrical Characteristics
DC Characteristics
Characteristics
Symbol
High-level input
voltage
VIH
Test Condition
â
Ta =
Ta = 25°C
â40 to 85°C
Unit
VCC
(V)
Min
Typ.
Max
Min
Max
2.0 1.50 â
â 1.50 â
3.0 2.10 â
â 2.10 â
V
5.5 3.85 â
â 3.85 â
Low-level input
voltage
VIL
2.0 â
â 0.50 â 0.50
â
3.0 â
â 0.90
â 0.90
V
5.5 â
â 1.65 â 1.65
2.0 1.9 2.0
â
1.9
â
High-level output
voltage
VOH
IOH = â50 μA
VIN
= VIH or
VIL
IOH = â4 mA
IOH = â24 mA
3.0 2.9 3.0
â
2.9
â
4.5 4.4 4.5
â
4.4
â
V
3.0 2.58 â
â 2.48 â
4.5 3.94 â
â 3.80 â
IOH = â75 mA (Note) 5.5 â
â
â 3.85 â
2.0 â
0.0 0.1
â
0.1
Low-level output
voltage
3-state output
off-state current
Input leakage
current
IOL = 50 μA
VIN
VOL
= VIH or
VIL
IOL = 12 mA
3.0 â
0.0 0.1
â
0.1
4.5 â
0.0 0.1
â
0.1
V
3.0 â
â 0.36 â 0.44
IOL = 24 mA
4.5 â
â 0.36 â 0.44
IOL = 75 mA (Note) 5.5 â
â
â
â 1.65
VIN = VIH or VIL
IOZ
VOUT = VCC or GND
5.5 â
â ±0.5 â ±5.0 μA
IIN
VIN = VCC or GND
5.5 â
â ±0.1 â ±1.0 μA
Quiescent supply
current
ICC
VIN = VCC or GND
5.5 â
â
8.0
â 80.0 μA
Note:
This spec indicates the capability of driving 50 ⦠transmission lines.
One output should be tested at a time for a 10 ms maximum duration.
4
2007-10-01
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