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TC58DVM92A1FT00 Datasheet, PDF (3/44 Pages) Toshiba Semiconductor – MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
VALID BLOCKS (1)
TC58DVM92A1FT00
SYMBOL
PARAMETER
MIN
TYP.
MAX
UNIT
NVB
Number of Valid Blocks
4016

4096
Blocks
(1) The device occasionally contains unusable blocks. Refer to Application Note (14) toward the end of this document.
(2) The first block (block address #00) is guaranteed to be a valid block at the time of shipment.
RECOMMENDED DC OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
Power Supply Voltage
VIH
High Level input Voltage
VIL
Low Level Input Voltage
* 2 V (pulse width lower than 20 ns)
MIN
2.7
2.0
0.3*
TYP.
3.3


MAX
3.6
VCC  0.3
0.8
UNIT
V
V
V
DC CHARACTERISTICS (Ta 0° to 70°C, VCC 2.7 V to 3.6 V)
SYMBOL
PARAMETER
CONDITION
MIN
IIL
Input Leakage Current
VIN 0 V to VCC

ILO
ICCO1
ICCO3
Output Leakage Current
VOUT 0 V to VCC

Operating Current (Serial Read) CE VIL, IOUT 0 mA, tcycle 50 ns 
Operating Current
(Command Input)
tcycle 50 ns

ICCO4
Operating Current (Data Input) tcycle 50 ns

Operating Current
ICCO5
(Address Input)
tcycle 50 ns

ICCO7
ICCO8
ICCS1
ICCS2
Programming Current
Erasing Current
Standby Current
Standby Current




CE VIH, WP 0V/VCC

CE VCC  0.2 V, WP 0V/VCC

VOH
High Level Output Voltage
IOH 400 PA
2.4
VOL
Low Level Output Voltage
IOL 2.1 mA

IOL ( RY/BY ) Output Current of RY/BY pin VOL 0.4 V

TYP.


10
10
10
10
10
10

10


8
MAX
r10
r10
30
30
30
30
30
30
1
50

0.4

UNIT
PA
PA
mA
mA
mA
mA
mA
mA
mA
PA
V
V
mA
2003-01-10 3/44